ICS854S058I Datasheet, PDF (5/16 Pages) Integrated Device Technology – One differential LVDS output pair

ICS854S058I Datasheet
8:1, DIFFERENTIAL-TO-LVDS CLOCK MULTIPLEXER
Table 5. AC Characteristics, V_DD = 3.3V ± 5%, T_A = -40°C to 85°C
Symbol
Parameter
Test Conditions
f_OUT
t_PD
Output Frequency
Propagation Delay;
NOTE 1
tjit(Ø)
Buffer Additive Phase Jitter,
RMS; Refer to Additive Phase
Jitter Section
155.52MHz, Integration Range:
12kHz – 20MHz
tsk(pp)
Part-to-Part Skew;
NOTE 2, 3
tsk(i)
Input Skew
t_R / t_F
MUX_ISOLATION
Output Rise/Fall Time
MUX Isolation;
NOTE 4
20% to 80%
155.52MHz, V_PP = 400mV
Minimum
300
75
Typical
0.065
85
Maximum
2.5
600
Units
GHz
ps
ps
300
ps
50
ps
250
ps
dB
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device
is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal
equilibrium has been reached under these conditions.
All parameters measured  1.0GHz unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Defined as skew between outputs on different devices operating at the same supply voltages and with equal load conditions. Using
the same type of inputs on each device, the outputs are measured at the differential cross points.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 4: Q/nQ output measured differentially. See Parameter Measurement Information for MUX Isolation diagram.
ICS854S058AGI REVISION A OCTOBER 29, 2012
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©2012 Integrated Device Technology, Inc.