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ICS854S058I Datasheet, PDF (12/16 Pages) Integrated Device Technology – One differential LVDS output pair
ICS854S058I Datasheet
8:1, DIFFERENTIAL-TO-LVDS CLOCK MULTIPLEXER
Power Considerations
This section provides information on power dissipation and junction temperature for the ICS854S058I.
Equations and example calculations are also provided.
1. Power Dissipation.
The total power dissipation for the ICS854S058I is the sum of the core power plus the power dissipation in the load(s).
The following is the power dissipation for VDD = 3.3V + 5% = 3.465V, which gives worst case results.
NOTE: Please refer to Section 3 for details on calculating power dissipation in the load.
• Power (core)MAX = VDD_MAX * IDD_MAX = 3.465V * 66mA = 228.7mW
2. Junction Temperature.
Junction temperature, Tj, is the temperature at the junction of the bond wire and bond pad directly affects the reliability of the device. The
maximum recommended junction temperature is 125°C. Limiting the internal transistor junction temperature, Tj, to 125°C ensures that the bond
wire and bond pad temperature remains below 125°C.
The equation for Tj is as follows: Tj = JA * Pd_total + TA
Tj = Junction Temperature
JA = Junction-to-Ambient Thermal Resistance
Pd_total = Total Device Power Dissipation (example calculation is in section 1 above)
TA = Ambient Temperature
In order to calculate junction temperature, the appropriate junction-to-ambient thermal resistance JA must be used. Assuming no air flow and
a multi-layer board, the appropriate value is 85.1°C/W per Table 6 below.
Therefore, Tj for an ambient temperature of 85°C with all outputs switching is:
85°C + 0.229W * 85.16°C/W = 104.5°C. This is below the limit of 125°C.
This calculation is only an example. Tj will obviously vary depending on the number of loaded outputs, supply voltage, air flow and the type of
board (multi-layer).
Table 6. Thermal Resistance JA for 24 Lead TSSOP, Forced Convection
JA by Velocity
Meters per Second
0
Multi-Layer PCB, JEDEC Standard Test Boards
85.1°C/W
1
79.7°C/W
2.5
76.5°C/W
ICS854S058AGI REVISION A OCTOBER 29, 2012
12
©2012 Integrated Device Technology, Inc.