71V016SA10PHG Datasheet, PDF (4/9 Pages) Integrated Device Technology – 3.3V CMOS Static RAM 1 Meg (64K x 16-Bit)

IDT71V016SA, 3.3V CMOS Static RAM
1 Meg (64K x 16-Bit)
AC Test Conditions
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
GND to 3.0V
1.5ns
1.5V
1.5V
See Figure 1, 2 and 3
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AC Test Loads
+1.5V
I/O
Z0 = 50Ω
50Ω
30pF
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Figure 1. AC Test Load
Commercial and Industrial Temperature Ranges
DATA OUT
5pF*
3.3V
320Ω
350Ω
*Including jig and scope capacitance.
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Figure 2. AC Test Load
(for tCLZ, tOLZ, tCHZ, tOHZ, tOW, and tWHZ)
7
6
ΔtAA, tACS
(Typical, ns) ⁵
4
3
2
1
•
•
•
•
•
•
•
8 20 40 60 80 100 120 140 160 180 200
CAPACITANCE (pF)
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Figure 3. Output Capacitive Derating
6.442