HCPL-7723 Datasheet, PDF (1/12 Pages) Agilent(Hewlett-Packard) – 50 MBd 2 ns PWD High Speed CMOS Optocoupler

Agilent HCPL-7723 & HCPL-0723
50 MBd 2 ns PWD
High Speed CMOS Optocoupler
Data Sheet
Description
Available in either 8-pin DIP or
SO-8 package style respectively, the
HCPL-7723 or HCPL-0723
optocoupler utilize the latest CMOS
IC technology to achieve out-
standing speed performance of
minimum 50 MBd data rate and
2 ns maximum pulse width
distortion.
Basic building blocks of HCPL-
7723/0723 are a CMOS LED
driver IC, a high speed LED and a
CMOS detector IC. A CMOS logic
input signal controls the LED
driver IC, which supplies current
to the LED. The detector IC
incorporates an integrated
photodiode, a high speed
transimpedance amplifier, and a
voltage comparator with an
output driver.
Functional Diagram
**V_DD1 1
8 V_DD2**
V_I 2
*3
GND₁ 4
LED1
SHIELD
7 NC*
I_O
6 V_O
5 GND₂
* PIN 3 IS THE ANODE OF THE INTERNAL LED AND MUST BE LEFT
UNCONNECTED FOR GUARANTEED DATASHEET PERFORMANCE.
PIN 7 IS NOT CONNECTED INTERNALLY.
** A 0.1 µF BYPASS CAPACITOR MUST BE CONNECTED BETWEEN
PINS 1 AND 4, AND 5 AND 8.
TRUTH TABLE
(POSITIVE LOGIC)
V_I, INPUT
H
L
LED1
OFF
ON
V_O, OUTPUT
H
L
Features
• +5 V CMOS compatibility
• High speed: 50 MBd min.
• 2 ns max. pulse width distortion
• 22 ns max. prop. delay
• 16 ns max. prop. delay skew
• 10 kV/µs min. common mode
rejection
• –40 to 85°C temperature range
• Safety and regulatory approvals
(Pending)
UL recognized
– 2500 V rms for 1 min. per UL1577
for HCPL-7723
– 3750 V rms for 1 min. per UL1577
for HCPL-0723
CSA component acceptance
notice #5
VDE 0884
– Viorm = 630 Vpeak for HCPL-7723
option 060
– Viorm = 560 Vpeak for HCPL-0723
option 060
Applications
• Digital fieldbus isolation: CC-Link,
DeviceNet, Profibus, SDS
• ^{Isolated A/D or D/A conversion}
• Multiplexed data transmission
• High Speed Digital Input/Output
• Computer peripheral interface
• Microprocessor system interface
CAUTION: It is advised that normal static precautions be taken in handling and assembly of
this component to prevent damage and/or degradation, which may be induced by ESD.