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R1LP0408C Datasheet, PDF (6/14 Pages) Hitachi Semiconductor – Wide Temperature Range Version 4 M SRAM (512-kword × 8-bit)
R1LP0408C-I Series
DC Characteristics
Parameter
Symbol Min Typ*1 Max Unit Test conditions
Input leakage current
|ILI|
Output leakage current
|ILO|
Operating current
ICC
Average operating current
ICC1
ICC2
Standby current
ISB
Standby current to +85°C
ISB1
to +40°C
ISB1
−20°C to +25°C
ISB1

1
µA Vin = VSS to VCC
  1 µA CS# = VIH or OE# = VIH or
WE# = VIL or VI/O = VSS to VCC
 1.5 3
mA CS# = VIL,
Others = VIH/ VIL, II/O = 0 mA
8
25 mA Min. cycle, duty = 100%,
CS# = VIL, Others = VIH/VIL
II/O = 0 mA
2
5 mA Cycle time = 1 µs,
duty = 100%,
II/O = 0 mA, CS# ≤ 0.2 V,
VIH ≥ VCC − 0.2 V, VIL ≤ 0.2 V
 0.1


0.5 mA
20*2 µA
10*3 µA
CS# = VIH
Vin ≥ 0 V, CS# ≥ VCC − 0.2 V
 1.0*2 10*2 µA
 1.0*3 3*3 µA
 0.8*2 10*2 µA
 0.8*3 3*3 µA
Output low voltage
VOL
  0.4 V IOL = 2.1 mA
Output high voltage
VOH
2.4   V IOH = −1.0 mA
VOH2
2.6   V IOH = −0.1 mA
Notes: 1. Typical values are at VCC = 5.0 V, Ta = +25°C and specified loading, and not guaranteed.
2. L version. (−7LI)
3. SL version. (−5SI)
Capacitance
(Ta = +25°C, f = 1.0 MHz)
Parameter
Symbol Min Typ Max
Input capacitance
Cin
8
Input/output capacitance
CI/O
  10
Note: 1. This parameter is sampled and not 100% tested.
Unit
pF
pF
Test conditions
Vin = 0 V
VI/O = 0 V
Note
1
1
Rev.1.00, Aug.01.2003, page 6 of 13