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HN58X24512I Datasheet, PDF (4/20 Pages) Hitachi Semiconductor – Two-wire serial interface 512k EEPROM (64-kword ´ 8-bit)
HN58X24512I
DC Characteristics (Ta = –40 to +85˚C, VCC = 1.8 V to 5.5 V)
Parameter
Symbol Min Typ Max Unit Test conditions
Input leakage current
I LI
—
—
2.0
µA
VCC = 5.5 V, Vin = 0 to 5.5 V
(SCL, SDA)
—
—
20
µA
VCC = 5.5 V, Vin = 0 to 5.5 V
(A0, A1, WP)
Output leakage current ILO
—
—
2.0
µA
VCC = 5.5 V, Vout = 0 to 5.5 V
Standby VCC current
I SB
—
1.0
3.0
µA
Vin = VSS or VCC
Read VCC current
I CC1
—
—
2.0
mA
VCC = 5.5 V, Read at 400 kHz
Write VCC current
I CC2
—
—
5.0
mA VCC = 5.5 V, Write at 400 kHz
Output low voltage
VOL2
—
—
0.4
V
VCC = 4.5 to 5.5 V, IOL = 1.6 mA
VCC = 2.5 to 4.5 V, IOL = 0.8 mA
VCC = 1.8 to 2.5 V, IOL = 0.4 mA
VOL1
—
—
0.2
V
VCC = 1.8 to 2.5 V, IOL = 0.2 mA
Capacitance (Ta = 25˚C, f = 1 MHz)
Parameter
Test
Symbol Min
Typ
Max
Unit
conditions
Input capacitance (A0 to A1, SCL, WP) Cin*1
—
—
6.0
pF
Vin = 0 V
Output capacitance (SDA)
CI/O* 1
—
—
Note: 1. This parameter is sampled and not 100% tested.
6.0
pF
Vout = 0 V
4