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MC9RS08LE4 Datasheet, PDF (9/30 Pages) Freescale Semiconductor, Inc – MCU Block Diagram
DC Characteristics
Table 7. DC Characteristics (Temperature Range = –40 to 85°C Ambient) (continued)
Num C
Parameter
Symbol
Min
Typical
Max
Unit
Input low voltage (VDD > 2.3 V) (all digital inputs)
—
—
0.30 × VDD V
6 C Input low voltage (1.8 V ≤ VDD ≤ 2.3 V)
(all digital inputs)
VIL
—
—
0.30 × VDD V
7 C Input hysteresis (all digital inputs)
Vhys
0.06 × VDD
—
—
V
8 P Input leakage current (per pin)
VIn = VDD or VSS, all input only pins
|IIn|
—
0.025
1.0
μA
9 P High impedance (off-state) leakage current (per pin)
VIn = VDD or VSS, all input/output
|IOZ|
—
10 P Internal pullup/pulldown resistors2(all port pins)
RPU
20
0.025
45
1.0
μA
65
kΩ
Output high voltage (port A)
11 C IOH = –5 mA (VDD ≥ 4.5 V)
IOH = –3 mA (VDD ≥ 3 V)
IOH = –2 mA (VDD ≥ 1.8 V)
12 C Maximum total IOH for all port pins
VOH
VDD – 0.8
—
—
—
|IOHT|
—
—
—
V
—
—
40
mA
Output low voltage (port A)
13 C IOL = 5 mA (VDD ≥ 4.5 V)
IOL = 3 mA (VDD ≥ 3 V)
VOL
—
—
IOL = 2 mA (VDD ≥ 1.8 V)
—
14 C Maximum total IOL for all port pins
dc injection current3, 4, 5 ,6
IOLT
—
15
C
VIn < VSS, VIn > VDD
Single pin limit
—
—
Total MCU limit, includes sum of all stressed pins
—
—
0.8
V
—
0.8
—
0.8
—
100
mA
—
0.2
mA
—
0.8
mA
16 C Input capacitance (all non-supply pins)
CIn
—
—
7
pF
1 This parameter is characterized and not tested on each device.
2 Measurement condition for pull resistors: VIn = VSS for pullup and VIn = VDD for pulldown.
3 All functional non-supply pins are internally clamped to VSS and VDD except the RESET/VPP which is internally clamped to VSS
only
4 Input must be current limited to the value specified. To determine the value of the required current-limiting resistor, calculate
resistance values for positive and negative clamp voltages, then use the larger of the two values.
5 Input must be current limited to the value specified. To determine the value of the required current-limiting resistor, calculate
resistance values for positive and negative clamp voltages, then use the larger of the two values.
6 This parameter is characterized and not tested on each device.
MC9RS08LE4 MCU Data Sheet, Rev. 2
Freescale Semiconductor
9