MC9RS08LE4 Datasheet, PDF (8/30 Pages) Freescale Semiconductor, Inc – MCU Block Diagram

DC Characteristics
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Table 5. ESD and Latch-up Test Conditions
Model
Human
Body
Machine
Latch-up
Description
Series resistance
Storage capacitance
Number of pulses per pin
Series resistance
Storage capacitance
Number of pulses per pin
Minimum input voltage limit
Maximum input voltage limit
Symbol
R1
C
—
R1
C
—
—
—
Value
1500
100
3
0
200
3
–2.5
7.5
Unit
Ω
pF
—
Ω
pF
—
V
V
Table 6. ESD and Latch-Up Protection Characteristics
No.
Rating¹
Symbol
Min
Max Unit
1
Human body model (HBM)
V_HBM
±2000
—
V
2
Machine model (MM)
V_MM
±200
—
V
3
Charge device model (CDM)
V_CDM
±500
—
V
4
Latch-up current at T_A = 85°C
Latch-up current at T_A = 85°C
I_LAT
±100²
I_LAT
±75³
—
mA
—
mA
1 _{Parameter is achieved by design characterization on a small sample size from typical devices}
under typical conditions unless otherwise noted.
2 _{These pins meet JESD78A Class II (section 1.2) Level A (section 1.3) requirement of ±100 mA.}
3 _{This pin meets JESD78A Class II (section 1.2) Level B (section 1.3) characterization to ±75 mA.}
3.6 DC Characteristics
This section includes information about power supply requirements, I/O pin characteristics, and power
supply current in various operating modes.
Table 7. DC Characteristics (Temperature Range = –40 to 85°C Ambient)
Num C
Parameter
Symbol
1
Supply voltage (run, wait and stop modes.)
0 < f_Bus <10MHz
V_DD
2 C Minimum RAM retention supply voltage applied to V_DD V_RAM
Low-voltage Detection threshold
3P
(V_DD falling) ^V_LVD
(V_DD rising)
4 C Power on RESET (POR) voltage
V_POR
Input high voltage (V_DD > 2.3V) (all digital inputs)
5 C _{Input high voltage (1.8 V ≤ VDD ≤ 2.3 V) (all digital}
V_IH
inputs)
Min
2.7
0.8¹
1.80
1.88
0.9
0.70 × V_DD
0.85 × V_DD
Typical
—
—
1.86
1.94
—
—
—
Max
Unit
5.5
—
—
V
1.95
V
2.03
1.7
V
—
V
—
V
MC9RS08LE4 MCU Data Sheet, Rev. 2
8
Freescale Semiconductor