MRF6S21140HR3 Datasheet, PDF (7/12 Pages) Freescale Semiconductor, Inc – RF Power Field Effect Transistors N-Channel Enhancement-Mode Lateral MOSFETs

TYPICAL CHARACTERISTICS
10¹⁰
10⁹
10⁸
10⁷
90 100 110 120 130 140 150 160 170 180 190 200 210
T_J, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours x ampere²
drain current. Life tests at elevated temperatures have correlated to
better than ±10% of the theoretical prediction for metal failure. Divide
MTTF factor by I_D2 for MTTF in a particular application.
Figure 12. MTTF Factor versus Junction Temperature
W - CDMA TEST SIGNAL
100
10
1
0.1
0.01
0.001
0.0001
W−CDMA. ACPR Measured in 3.84 MHz Channel
Bandwidth @ ±5 MHz Offset. IM3 Measured in
3.84 MHz Bandwidth @ ±10 MHz Offset. PAR =
8.5 dB @ 0.01% Probability on CCDF
0
2
4
6
8
10
PEAK−TO−AVERAGE (dB)
Figure 13. CCDF W - CDMA 3GPP, Test Model 1,
64 DPCH, 67% Clipping, Single - Carrier Test Signal
+20
3.84 MHz
+30
Channel BW
0
−10
−20
−30
−40
−50
−ACPR in +ACPR in
−60 −IM3 in
3.84 MHz BW 3.84 MHz BW +IM3 in
−70 ^{3.84 MHz BW}
3.84 MHz BW
−80
−25 −20 −15 −10 −5 0 5 10 15 20 25
f, FREQUENCY (MHz)
Figure 14. 2-Carrier W-CDMA Spectrum
RF Device Data
Freescale Semiconductor
MRF6S21140HR3 MRF6S21140HSR3
7