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MRF5S21045NR1 Datasheet, PDF (7/16 Pages) Freescale Semiconductor, Inc – RF Power Field Effect Transistors | |||
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TYPICAL CHARACTERISTICS
109
108
107
106
90 100 110 120 130 140 150 160 170 180 190 200 210
TJ, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours x ampere2
drain current. Life tests at elevated temperatures have correlated to
better than ±10% of the theoretical prediction for metal failure. Divide
MTTF factor by ID2 for MTTF in a particular application.
Figure 12. MTTF Factor versus Junction Temperature
W - CDMA TEST SIGNAL
100
10
1
0.1
0.01
0.001
WâCDMA. ACPR Measured in 3.84 MHz Channel
Bandwidth @ $5 MHz Offset. IM3 Measured in
3.84 MHz Bandwidth @ $10 MHz Offset. PAR =
8.5 dB @ 0.01% Probability on CCDF
0.0001
0
2
4
6
8
10
PEAK âTOâAVERAGE (dB)
Figure 13. CCDF W - CDMA 3GPP, Test Model 1,
64 DPCH, 67% Clipping, Single - Carrier Test Signal
+20
3.84 MHz
+30
Channel BW
0
â 10
â 20
â 30
â 40
â 50
âACPR in +ACPR in
â60 âIM3 in
3.84 MHz BW 3.84 MHz BW +IM3 in
â70 3.84 MHz BW
3.84 MHz BW
â 80
â25 â20 â15 â10 â5 0 5 10 15 20 25
f, FREQUENCY (MHz)
Figure 14. 2-Carrier W-CDMA Spectrum
RF Device Data
Freescale Semiconductor
MRF5S21045NR1 MRF5S21045NBR1
7
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