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33661 Datasheet, PDF (7/21 Pages) Freescale Semiconductor, Inc – Local Area Network (LIN) Enhanced Physical Interface with Selectable Slew Rate
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 4. Dynamic Electrical Characteristics
Characteristics noted under conditions 7.0 V ≤ VSUP ≤ 18 V, - 40°C ≤ TA ≤ 125°C, GND = 0 V unless otherwise noted. Typical
values noted reflect the approximate parameter means at TA = 25°C under nominal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
LIN OUTPUT TIMING CHARACTERISTICS FOR NORMAL MODE
Dominant Propagation Delay Time TXD to LIN (6)
Measurement Threshold (50% TXD to 58.1% VSUP)
Measurement Threshold (50% TXD to 28.4% VSUP)
Recessive Propagation Delay Time TXD to LIN (6)
Measurement Threshold (50% TXD to 42.2% VSUP)
Measurement Threshold (50% TXD to 74.4% VSUP)
µs
t DOM (MIN)
—
—
50
t DOM (MAX)
—
—
50
µs
t REC (MIN)
—
—
50
t REC (MAX)
—
—
50
Propagation Delay Time Symmetry
t DOM (MIN) to t REC (MAX)
t DOM (MAX) to t REC (MIN)
µs
dt1
- 10.44
—
dt2
- 10.44
—
8.12
8.12
LIN OUTPUT TIMING CHARACTERISTICS FOR SLOW MODE
Dominant Propagation Delay Time TXD to LIN (6)
Measurement Threshold (50% TXD to 61.6% VSUP)
Measurement Threshold (50% TXD to 25.1% VSUP)
Recessive Propagation Delay Time TXD to LIN (6)
Measurement Threshold (50% TXD to 38.9% VSUP)
Measurement Threshold (50% TXD to 77.8% VSUP)
t DOM (MIN)
—
t DOM (MAX)
—
t REC (MIN)
—
t REC (MAX)
—
µs
—
100
—
100
µs
—
100
—
100
Propagation Delay Time Symmetry
t DOM (MIN) to t REC (MAX)
t DOM (MAX) to t REC (MIN)
µs
dt1S
- 21.88
—
dt 2S
- 21.88
—
17.44
17.44
LIN OUTPUT DRIVER FAST MODE
LIN Fast Slew Rate (Programming Mode)
Fast Slew Rate
dv/dt fast
V/µs
—
15
—
LIN PIN
Overcurrent Shutdown Delay Time (7)
LIN RECEIVER CHARACTERISTICS
Receiver Dominant Propagation Delay Time (8)
LIN LOW to RXD LOW
Receiver Recessive Propagation Delay Time (8)
LIN HIGH to RXD HIGH
t OV-DELAY
—
10
—
µs
t RL
µs
—
3.5
6.0
t RH
µs
—
3.5
6.0
Receiver Propagation Delay Time Symmetry
t RL - t RH
t R-SYM
µs
- 2.0
—
2.0
Notes
6 7.0 V ≤ VSUP ≤ 18 V. Bus load R0 and C0: 1.0 nF/1.0 kΩ, 6.8 nF/660 Ω, 10 nF/500 Ω.
7 This parameter is guaranteed by design; however, it is not production tested.
8 Measured between LIN signal threshold VLINL or VLINH and 50% of RXD signal.
Analog Integrated Circuit Device Data
Freescale Semiconductor
33661
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