33661 Datasheet, PDF (6/21 Pages) Freescale Semiconductor, Inc – Local Area Network (LIN) Enhanced Physical Interface with Selectable Slew Rate

ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 3. Static Electrical Characteristics (continued)
Characteristics noted under conditions 7.0 V ≤ V_SUP ≤ 18 V, -40°C ≤ T_A ≤ 125°C, GND = 0 V unless otherwise noted. Typical
values noted reflect the approximate parameter means at T_A = 25°C under nominal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
LIN PIN (VOLTAGE EXPRESSED VERSUS V_SUP VOLTAGE)
Low-Level Bus Voltage (Dominant State)
External Bus Pullup 500 Ω
V_DOM
V
—
—
1.4
High-Level Bus Voltage (Recessive State)
TXD HIGH, I_OUT = 1.0 µA
Internal Pullup Resistor to VSUP _{(Normal Mode)}
Internal Pullup Current Source (Sleep Mode)
Overcurrent Shutdown Threshold
Leakage Current to GND
Recessive State, 8.0 V ≤ V_SUP ≤ 18 V, 8.0 V ≤ V_LIN ≤ 18 V
GND Disconnected, V_GND = V_SUP, V_LIN at - 18 V
VSUP Disconnected, V_LIN at +18 V
V_REC
V
V_SUP - 1.0
—
—
R_PU
20
30
47
kΩ
I_PU
—
20
—
µA
I_OV-CUR
50
75
150
mA
I_LEAK
0
3.0
20
µA
- 1.0
—
1.0
mA
—
1.0
10
µA
LIN Receiver, Low-Level Input Voltage
TXD HIGH, RXD LOW
LIN Receiver, High-Level Input Voltage
TXD HIGH, RXD HIGH
LIN Receiver Threshold Center
(V_{LINH -} V_LINL) / 2
LIN Receiver Input Voltage Hysteresis
V_{LINH -} V_LINL
LIN Wake-Up Threshold Voltage
INH OUTPUT PIN
V_LINL
0 V_SUP
V
—
0.4 V_SUP
V_LINH
V
0.6 V_SUP
—
V_SUP
V_LINTH
V
0.475 V_SUP 0.5 V_SUP 0.525 V_SUP
V_LINHYST
—
V
—
0.175 V_SUP
V_LINWU
—
0.5 V_SUP
—
V
Driver ON Resistance (Normal Mode)
Leakage Current (Sleep Mode)
0 V < V_INH < V_SUP
INH_ON
—
35
70
Ω
I_LEAK
µA
0
—
5.0
WAKE INPUT PIN
Typical Wake-Up Threshold Voltage (EN = 0 V, 7.0 V ≤ V_SUP ≤ 18 V) ⁽⁵⁾
V_WUTH
V
HIGH-to-LOW Transition
0.3 V_SUP 0.43 V_SUP 0.55 V_SUP
LOW-to-HIGH Transition
0.4 V_SUP 0.55 V_SUP 0.65 V_SUP
Wake-Up Threshold Voltage Hysteresis
V_WUHYST
0.1 V_SUP 0.16 V_SUP 0.2 V_SUP
V
WAKE Input Current
V_WAKE < 27 V
I_WU
µA
—
1.0
5.0
Notes
4 This parameter is guaranteed by design; however, it is not production tested.
5 When V_SUP > 18 V, the wake-up voltage thresholds remain identical to the wake-up thresholds at 18 V.
33661
6
Analog Integrated Circuit Device Data
Freescale Semiconductor