MC9S08DV60 Datasheet, PDF (388/414 Pages) Freescale Semiconductor, Inc – HCS08 Microcontrollers

Appendix A Electrical Characteristics
A.14.1 Radiated Emissions
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package
orientations (North and East). For more detailed information concerning the evaluation results, conditions
and setup, please refer to the EMC Evaluation Report for this device.
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal
to the reported emissions levels.
Table A-18. Radiated Emissions for 3M05C Mask Set
Parameter
Symbol Conditions
Frequency
f_osc/f_CPU
Level¹
(Max)
Unit
V_{RE_TEM}
V_DD = 5
T_A = +25^oC
64 LQFP
0.15 – 50 MHz
50 – 150 MHz
18
dBμV
18
Radiated emissions,
electric field — Conditions -
150 – 500 MHz
16 MHz
13
Crystal
500 – 1000 MHz 20 MHz Bus
7
IEC Level
L
—
SAE Level
2
—
1 _{Data based on qualification test results.}
MC9S08DV60 Series Data Sheet, Rev 3
388
Freescale Semiconductor