K20P144M100SF2_1109 Datasheet, PDF (34/74 Pages) Freescale Semiconductor, Inc – K20 Sub-Family Data Sheet

Peripheral operating requirements and behaviors
6.4.1.4 Reliability specifications
Table 23. NVM reliability specifications
Symbol Description
t_nvmretp10k Data retention after up to 10 K cycles
t_nvmretp1k Data retention after up to 1 K cycles
t_nvmretp100 Data retention after up to 100 cycles
n_nvmcycp Cycling endurance
Min.
Program Flash
5
10
15
10 K
Typ.¹
50
100
100
35 K
Max.
Unit
Notes
—
years
2
—
years
2
—
years
2
—
cycles
3
1. Typical data retention values are based on measured response accelerated at high temperature and derated to a constant
25°C use profile. Engineering Bulletin EB618 does not apply to this technology.
2. Data retention is based on T_javg = 55°C (temperature profile over the lifetime of the application).
3. Cycling endurance represents number of program/erase cycles at -40°C ≤ T_j ≤ 125°C.
6.4.2 EzPort Switching Specifications
Table 24. EzPort switching specifications
Num
EP1
EP1a
Description
Operating voltage
EZP_CK frequency of operation (all commands except
READ)
EZP_CK frequency of operation (READ command)
Min.
1.71
—
—
EP2
EZP_CS negation to next EZP_CS assertion
EP3
EZP_CS input valid to EZP_CK high (setup)
EP4
EZP_CK high to EZP_CS input invalid (hold)
EP5
EZP_D input valid to EZP_CK high (setup)
EP6
EZP_CK high to EZP_D input invalid (hold)
EP7
EZP_CK low to EZP_Q output valid
EP8
EZP_CK low to EZP_Q output invalid (hold)
EP9
EZP_CS negation to EZP_Q tri-state
2 x t_{EZP_CK}
5
5
2
5
—
0
—
Max.
3.6
f_SYS/2
f_SYS/8
—
—
—
—
—
16
—
12
Unit
V
MHz
MHz
ns
ns
ns
ns
ns
ns
ns
ns
K20 Sub-Family Data Sheet Data Sheet, Rev. 6, 9/2011.
34
Freescale Semiconductor, Inc.