S9S08SC4E0MTG Datasheet, PDF (24/31 Pages) Freescale Semiconductor, Inc – MC9S08SC4 8-Bit Microcontroller Data Sheet

Chapter 3 Electrical Characteristics
3.13 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the MCU resides. Board
design and layout, circuit topology choices, location and characteristics of external components as well as MCU software
operation all play a significant role in EMC performance. The system designer should consult Freescale applications notes such
as AN2321, AN1050, AN1263, AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC
performance.
3.13.1 Radiated Emissions
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell method in accordance
with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed with the microcontroller installed on a
custom EMC evaluation board while running specialized EMC test software. The radiated emissions from the microcontroller
are measured in a TEM cell in two package orientations (North and East).
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal to the reported
emissions levels.
Table 3-15. Radiated Emissions, Electric Field
Parameter
Symbol Conditions
Frequency
f_OSC/f_BUS
Level¹
(Max)
Unit
Radiated emissions,
electric field
V_{RE_TEM}
V_DD = 5 V
0.15 – 50 MHz 4 MHz crystal
–7
T_A = +25^oC
package type
50 – 150 MHz
8 MHz bus
–11
16-TSSOP
150 – 500 MHz
–11
500 – 1000 MHz
–10
IEC Level
N
SAE Level
1
dBμV
—
—
1 _{Data based on qualification test results.}
MC9S08SC4 MCU Series Data Sheet, Rev. 4
24
Freescale Semiconductor