MRF5S21150HR3 Datasheet, PDF (2/12 Pages) Freescale Semiconductor, Inc – RF Power Field Effect Transistors N-Channel Enhancement-Mode Lateral MOSFETs

Table 3. ESD Protection Characteristics
Test Conditions
Class
Human Body Model
1 (Minimum)
Machine Model
M3 (Minimum)
Charge Device Model
C7 (Minimum)
Table 4. Electrical Characteristics (T_C = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
Off Characteristics
Zero Gate Voltage Drain Leakage Current
(V_DS = 65 Vdc, V_GS = 0 Vdc)
I_DSS
—
—
10
μAdc
Zero Gate Voltage Drain Leakage Current
(V_DS = 28 Vdc, V_GS = 0 Vdc)
I_DSS
—
—
1
μAdc
Gate- Source Leakage Current
(V_GS = 5 Vdc, V_DS = 0 Vdc)
I_GSS
—
—
1
μAdc
On Characteristics
Gate Threshold Voltage
(V_DS = 10 Vdc, I_D = 360 μAdc)
V_GS(th)
2.5
—
3.5
Vdc
Gate Quiescent Voltage
(V_DS = 28 Vdc, I_D = 1300 mAdc)
V_GS(Q)
—
3.7
—
Vdc
Drain- Source On - Voltage
(V_GS = 10 Vdc, I_D = 3.6 Adc)
V_DS(on)
—
0.26
0.3
Vdc
Forward Transconductance
(V_DS = 10 Vdc, I_D = 3.6 Adc)
g_fs
—
9
—
S
Dynamic Characteristics ⁽¹⁾
Reverse Transfer Capacitance
(V_DS = 28 Vdc ± 30 mV(rms)ac @ 1 MHz, V_GS = 0 Vdc)
C_rss
—
3.2
—
pF
Functional Tests (In Freescale Test Fixture, 50 ohm system) V_DD = 28 Vdc, I_DQ = 1300 mA, P_out = 33 W Avg., f1 = 2112.5 MHz,
f2 = 2122.5 MHz and f1 = 2157.5 MHz, f2 = 2167.5 MHz, 2 - carrier W - CDMA, 3.84 MHz Channel Bandwidth Carriers. ACPR measured in
3.84 MHz Channel Bandwidth @ ±5 MHz Offset. IM3 measured in 3.84 MHz Bandwidth @ ±10 MHz Offset. PAR = 8.5 dB @ 0.01%
Probability on CCDF.
Power Gain
G_ps
11
12.5
—
dB
Drain Efficiency
η_D
23
25
—
%
Intermodulation Distortion
IM3
- 37
- 35
dBc
Adjacent Channel Power Ratio
ACPR
—
- 39
- 37
dBc
Input Return Loss
IRL
—
- 12
-9
dB
1. Part internally matched both on input and output.
MRF5S21150HR3 MRF5S21150HSR3
2
RF Device Data
Freescale Semiconductor