33797 Datasheet, PDF (14/34 Pages) Freescale Semiconductor, Inc – Four Channel Squib Driver IC

ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 5. Dynamic Electrical Characteristics (continued)
Characteristics noted under conditions 4.75 V ≤ V_DD ≤ 5.25 V; 7.0 V ≤ V_{VFIRE_XX} ≤ 35 V; V_{VDIAG_X} = V_{VFIRE_XX}; FEN 1 = FEN 2
= V_DD; R_{R_LIMIT_X} = 10 kΩ ±1%, R_{R_DIAG} = 10 kΩ ±1%, -40°C ≤ T_A ≤ +85°C, GND = 0 unless otherwise noted. Typical values
noted reflect the approximate parameter means at T_A = 25°C under nominal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
FET DRIVERS
Turn-On Delay Time
CS ↑ to 80% I_HS
t_ON
µs
–
–
72
Turn-Off Delay Time
CS ↑ to 20% I_HS
t_OFF
µs
–
–
10
Diagnostic Timing / Resolution
t_RESOLUTION
µs
5.0 V ≤ V_{VDIAG_X} ≤ 35 V, I_HS ≥ I_MEAS, 0 s ≤ t_{MEASURE_TIME} ≤ 6.375 ms,
C_{SQUIB_HI} = 0.12 µF, C_{SQUIB_LO} = 0.12 µF
21.25
25
28.75
DIAGNOSTIC DELAY TIME
Squib Resistance Diagnostic Delay Time ⁽²⁰⁾
t_DIAG1
From CSB ↑ Until Transistor Test Results Are Valid, C_{SQUIB_HI} = 0.12 µF,
C_{SQUIB_LO} = 0.12 µF
–
Squib Open / Short Diagnostic Delay Time ⁽²⁰⁾
From CSB ↑ Until Squib Open / Short Diagnostic Results Are Valid,
C_{SQUIB_HI} = 0.12 µF, C_{SQUIB_LO} = 0.12 µF
t_DIAG2
–
VDIAG Supply Diagnostic Delay Time From CSB ↑ until VDIAG Diagnostic
Results Are Valid ⁽²⁰⁾
t_DIAG4
–
V_FIRE Supply Diagnostic Delay Time ⁽²⁰⁾
t_DIAG6
15 V ≤ V_{VDIAG_X} ≤ 35 V, From CSB ↑ Until High-Side Safing Sensor
Diagnostic Results Are Valid, C_VDIAG < 0.015 µF
–
High-Side Safing Sensor Diagnostic Delay Time ⁽²⁰⁾
t_DIAG7
15 V ≤ V_{VDIAG_X} ≤ 35 V, From CSB ↑ Until High-Side Safing Sensor
Diagnostic Results Are Valid, C_VDIAG < 0.015 µF
–
FET Drivers High- and Low-Side Driver Transistor Diagnostic Delay Time ⁽²⁰⁾
t_DIAG9
15 V ≤ V_{VDIAG_X} ≤ 35 V, From CSB ↑ Until Transistor Test Results Are
Valid, C_{SQUIB_HI} = 0.12 µF, C_{SQUIB_LO} = 0.12 µF, C_VDIAG < 0.015 µF
–
VFIRE_RTN Diagnostic Delay Time ⁽²⁰⁾
From CSB ↑ Until VFIRE_RTN Diagnostic Results Are Valid
t_DIAG10
–
Squib Continuity Diagnostic Delay Time ⁽²⁰⁾
From CSB ↑ Until V_THSQBCON Diagnostic Results Are Valid
t_DIAG11
–
Squib Short Between Firing Loops Diagnostic Delay Time From CSB ↑ Until
V_THSSQB Diagnostic Results Are Valid ⁽²⁰⁾
t_DIAG12
–
µs
–
300
µs
–
3000
µs
–
3000
µs
–
1000
µs
–
1000
µs
–
1000
µs
–
300
µs
–
3000
µs
–
3000
FEN INPUT PIN
Minimum Pulse Width
Notes
20 Guaranteed by Characterization
FEN_FILTER
12
14
16
µs
33797
14
Analog Integrated Circuit Device Data
Freescale Semiconductor