33797 Datasheet, PDF (13/34 Pages) Freescale Semiconductor, Inc – Four Channel Squib Driver IC

ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 5. Dynamic Electrical Characteristics
Characteristics noted under conditions 4.75 V ≤ V_DD ≤ 5.25 V; 7.0 V ≤ V_{VFIRE_XX} ≤ 35 V; V_{VDIAG_X} = V_{VFIRE_XX}; FEN 1 = FEN 2
= V_DD; R_{R_LIMIT_X} = 10 kΩ ±1%, R_{R_DIAG} = 10 kΩ ±1%, -40°C ≤ T_A ≤ +85°C, GND = 0 unless otherwise noted. Typical values
noted reflect the approximate parameter means at T_A = 25°C under nominal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
SERIAL INTERFACE
CLK Cycle Time (1/FCLK) ⁽¹⁸⁾
CLK High Time ⁽¹⁸⁾
V_CLK > V_DD x 70%
CLK Low Time ⁽¹⁸⁾
V_CLK < V_DD x 20%
Clock Rise Time ⁽¹⁸⁾
V_CLK = 20% V_DD to 70% V_DD, C_LOAD = 100 pF
Clock Fall Time ⁽¹⁸⁾
V_CLK = 70% V_DD to 20% V_DD, C_LOAD = 100 pF
Data Out Rise Time ⁽¹⁹⁾
V_DO = 20% V_DD to 70% V_DD, C_LOAD = 100 pF
Data Out Fall Time ⁽¹⁹⁾
V_DO = 70% V_DD to 20% V_DD, C_LOAD = 100 pF
Chip Select Setup Time ⁽¹⁹⁾
CSB _↓ Before CLK _↑
Chip Select Hold Time ⁽¹⁹⁾
CLK _↓ Before CSB _↑
Data In Setup Time ⁽¹⁹⁾
D1 Valid Before CLK
t_CYC
200
–
t_HI
34
–
t_LO
34
–
t_RISE
–
–
t_FALL
–
–
t_R
–
–
t_F
–
–
t_LEAD
62
–
t_LAG
62
–
t_SU
30
–
–
ns
ns
–
ns
–
ns
20
ns
20
ns
20
ns
20
ns
–
ns
–
ns
–
Data In Hold Time ⁽¹⁹⁾
D1 Hold Time After CLK ↑
Data Out Access Time ⁽¹⁹⁾
CSB to D0 Valid
t_H
ns
30
–
–
t_A
ns
–
–
62
Data Out Disable Time ⁽¹⁹⁾
CSB ↑ to D0 HI-Z
Data Out Valid Time ⁽¹⁹⁾
CLK ↑ to D0 Valid, C_LOAD = 100 pF
Data Out Hold Time ⁽¹⁹⁾
D0 held After CLK ↑
t_DIS
ns
–
–
62
t_V
ns
–
–
75
t_HO
0.0
–
ns
–
Diagnostic Delay Time (Between Two Successive Commands)
t_DIAG
2.5
–
–
µs
Notes
18 Determined by Design
19 Guaranteed by Characterization
Analog Integrated Circuit Device Data
Freescale Semiconductor
33797
13