FAN41501 Datasheet, PDF (8/11 Pages) Fairchild Semiconductor – Ground Fault Interrupter Self-Test Digital Controller

Ground Fault Tests
SCR, GFI, sense coil, and solenoid failures.
Figure 7. SCR Test Ch1: SCR Test (Pin 1), Ch 2:
Phase (Pin 4), Ch 3: EOL Alarm (Pin 5), Ch 4: Fault
Test (Pin 6)⁽⁸⁾
Figure 8. SCR Test Ch1: SCR Test (Pin 1);
Ch2: Phase (Pin 4); Ch3: EOL Alarm (Pin 5),
Ch4: Fault Test (Pin 6)⁽⁹⁾
Figure 9. GFI / Sense Coil Tests Ch1: SCR Anode Figure 10. Solenoid Test Ch1: SCR Anode (100 V/Div),
(100 V/div), Ch2: Phase (Pin 4), Ch3: EOL Alarm
(Pin 5), Ch4: Fault Test (Pin 6)⁽¹⁰⁾
Ch2: Phase (Pin 4), Ch3: EOL Alarm (Pin 5),
Ch4: Fault Test (Pin 6)⁽¹¹⁾
Notes:
8. This test is with the SCR disabled. The EOL alarm
signal is enabled after “time out” 66 ms timer has
expired. The EOL alarm signal is connected to the
gate of a SCR.
9. This test is the same as Figure 7, except for the time
scale. After a self-test failure, an EOL alarm pulse is
generated every one second.
10. This test is with the FAN4149 GFI controller disabled.
11. This test is with the solenoid open.
12. This test is with the Phase pin open.
13. If no signal is detected for the Phase pin within 60 ms
of the POR, an EOL alarm is enabled. The SCR is
Figure 11. Phase Pin, Continuity Test; Ch1: VDD (Pin
3), Ch2: Phase (Pin 4), Ch3: EOL Alarm (Pin 5)^(12,13)
enabled, which causes the VDD voltage to drop and
generates a POR cycle.
© 2014 Fairchild Semiconductor Corporation
FAN41501 • 1.0.1
8
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