FAN41501 Datasheet, PDF (4/11 Pages) Fairchild Semiconductor – Ground Fault Interrupter Self-Test Digital Controller

Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
ICC Supply Current
VCC Supply Voltage
TSTG Storage Temperature Range
ESD Electrostatic Discharge Capability
Condition
Continuous Current, VDD to GND
Continuous Voltage, VDD to GND
Continuous Voltage to Neutral, All Other Pins
Human Body Model, ANSI / ESDA / JEDEC
JS-001-2012
Charged Device Model, JESD22-C101
Min.
-0.8
-0.8
-65
Max.
10
7.0
7.0
+150
2.5
1.0
Unit
mA
V
V
°C
kV
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the data sheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings. Unless otherwise specified, refer to Figure 1.
TA=25°C, ISHUNT=1 mA, and phase=60 Hz.
Symbol
Parameter
VREG
Power Supply Shunt Regulator
Voltage
VUVLO_RST Under-Voltage Reset
IQ
tFIRST
tPER
tTESTOUT
Quiescent Current
First Timer Period
Periodic Timer
Test Cycle Time Out
tPHASE Phase Continuity Check Time Out
VPHASE_H Phase Voltage Clamp HIGH
VPHASE_L Phase Voltage Clamp LOW
IPHASE_MAX Phase Maximum Current
VSCR_H SCR Test Input Clamp HIGH
VSCR_L SCR Test Input Clamp LOW
ISCR_MAX SCR Test Maximum Current
ITEST Fault Test Current
VEOL_L EOL Alarm V_OL
VEOL_H EOL Alarm V_OH
fEOL EOL Alarm
IEOL EOL Alarm I_OUT
Conditions
VDD to GND
VDD to GND
Rising Hysteresis
VDD to GND= 4.5 V
VDD > 2.5 V
Steady State
Fault Testing
Phase Pin Continuity Check
at Startup
IH = 170 µA
IL = -170 µA
ISHUNT = 1.5 mA
IH = 170 µA
IL = -170 µA
ISHUNT = 1.5 mA
Test Cycle
No Load
No Load
Latched Fault Output
ISHUNT = 2.0 mA
Min.
5.10
2.2
350
0.812
4400
54
40
5.8
-0.8
-300
5.0
-0.8
-300
400
4.80
3.00
1
Typ.
5.35
2.5
150
450
1.016
5400
66
60
6.3
-0.6
5.4
-0.6
500
0
5.25
3.75
Max.
5.70
2.7
550
1.220
6400
78
80
6.6
-0.4
300
5.8
-0.4
300
200
4.25
Unit
V
V
mV
µA
s
s
ms
ms
V
V
µA
V
V
µA
µA
mV
V
Hz
mA
© 2014 Fairchild Semiconductor Corporation
FAN41501 • 1.0.1
4
www.fairchildsemi.com