FAN41501 Datasheet, PDF (7/11 Pages) Fairchild Semiconductor – Ground Fault Interrupter Self-Test Digital Controller

Typical Performance Characteristics
Pass testing of all key components. Refer to evaluation board (see www.fairchildsemi.com for details).
Figure 4. Pass GFCI, Sense Coil, Solenoid, SCR
Tests; Ch Math: VAC Input 200 V/Div, Ch3: SCR
Gate, Ch4: Fault Test (Pin 6)⁽⁶⁾
Figure 5. Pass Simulated Ground Fault Test;
Ch Math: VAC Input 200 V/Div, Ch3: SCR Gate,
Ch4: Fault Test (Pin 6)
Figure 6. Pass Simulated Ground Fault Test;
Ch1: SCR Test (Pin 1), Ch2: Phase (Pin 4),
Ch3: SCR Gate, Ch4: Fault Test (Pin 6)⁽⁷⁾
Notes:
6. Anode voltage is tested during the positive half cycle (internal latch set when VAC > 85 Vrms).
7. During the simulated ground fault test, the SCR discharges the pre-biased SCR Test pin.
© 2014 Fairchild Semiconductor Corporation
FAN41501 • 1.0.1
7
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