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FQNL2N50BTA Datasheet, PDF (2/8 Pages) Fairchild Semiconductor – N-Channel QFET MOSFET 500 V, 0.35 A, 5.3
Package Marking and Ordering Information
Part Number
FQNL2N50BTA
Top Mark
FQNL2N50B
Package
TO-92L
Packing Method Reel Size
AMMO
N/A
Tape Width
N/A
Quantity
2000 units
Electrical Characteristics
Symbol
Parameter
TC = 25°C unless otherwise noted.
Test Conditions
Min. Typ. Max. Unit
Off Characteristics
BVDSS Drain-Source Breakdown Voltage
VGS = 0 V, ID = 250 µA
500 --
∆BVDSS Breakdown Voltage Temperature
/ ∆TJ Coefficient
ID = 250 µA, Referenced to 25°C -- 0.48
IDSS
Zero Gate Voltage Drain Current
VDS = 500 V, VGS = 0 V
VDS = 400 V, TC = 125°C
--
--
--
--
IGSSF
Gate-Body Leakage Current, Forward VGS = 30 V, VDS = 0 V
--
--
IGSSR
Gate-Body Leakage Current, Reverse VGS = -30 V, VDS = 0 V
--
--
--
--
1
10
100
-100
V
V/°C
µA
µA
nA
nA
On Characteristics
VGS(th) Gate Threshold Voltage
RDS(on)
gFS
Static Drain-Source
On-Resistance
Forward Transconductance
VDS = VGS, ID = 250 µA
VDS = VGS, ID = 250 mA
VGS = 10 V, ID = 0.175 A
VDS = 50 V, ID = 0.175 A
2.3 3.0 3.7
V
3.6 4.3 5.0
V
-- 4.2 5.3
Ω
-- 0.72
--
S
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
VDS = 25 V, VGS = 0 V,
f = 1.0 MHz
-- 180 230
pF
--
30
40
pF
--
4
6
pF
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDD = 250 V, ID = 2.1 A,
RG = 25 Ω
--
6
20
ns
--
25
60
ns
--
10
30
ns
(Note 3)
--
20
50
ns
VDS = 400 V, ID = 2.1 A,
-- 6.0 8.0
nC
VGS = 10 V
-- 1.3
--
nC
(Note 3)
--
3.0
--
nC
Drain-Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain-Source Diode Forward Current
ISM
Maximum Pulsed Drain-Source Diode Forward Current
VSD
Drain-Source Diode Forward Voltage VGS = 0 V, IS = 0.35 A
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
VGS = 0 V, IS = 2.1 A,
dIF / dt = 100 A/µs
--
--
0.35
A
--
--
1.4
A
--
--
1.4
V
-- 195
--
ns
-- 0.69
--
µC
Notes:
1. Repetitive rating : pulse-width limited by maximum junction temperature.
2. ISD ≤ 2.1 A, di/dt ≤ 200 A/µs, VDD ≤ BVDSS, starting TJ = 25°C.
3. Essentially independent of operating temperature.
©2001 Fairchild Semiconductor Corporation
2
FQNL2N50B Rev. C1
www.fairchildsemi.com