XR-T7295 Datasheet, PDF (13/20 Pages) Exar Corporation – DS3/Sonet STS-1 Integrated Line Receiver

XR-T7295
Data
Rate
REQB
Min.
Max.
LOSTHR
Threshold
Threshold
Unit
DS3
0
0
60
220
mV pk
V_DD/2
40
V_DD
25
1
0
45
145
mV pk
90
mV pk
175
mV pk
V_DD/2
30
V_DD
20
STS-1
0
0
75
115
mV pk
70
mV pk
275
mV pk
V_DD/2
50
V_DD
30
1
0
55
185
mV pk
115
mV pk
220
mV pk
V_DD/2
35
V_DD
25
145
mV pk
90
mV pk
Notes
- Lower threshold is 1.5 dB below upper threshold.
- The RLOS alarm is an indication of the presence of an input signal, not a bit error rate indication. Table 1 gives the minimum
input amplitude needed for error free operation (BER < 1e-⁹) Independent of the RLOS state, the device will attempt to recover
correct timing data. The RLOS low-to-high transition typically occurs 1dB below the high to low transition.
Table 7. Analog Loss-of-Signal Thresholds
RECOVERED CLOCK AND DATA TIMING
Table 8 and Figure 11 summarize the timing relationships
between the logic signals RCLK, RPDATA, and RNDATA.
The duty cycle is referenced to V_DD/2 threshold level.
RPDATA and RNDATA change on the rising edge of
RCLK and are valid during the falling edge of RCLK. A
positive pulse at R_IN creates a high level on RPDATA and
a low level on RNDATA. A negative pulse at the input
creates a high level on RNDATA and a low level on
RPDATA, and a received zero produces low levels on
both RPDATA and RNDATA.
IN-CIRCUIT TEST CAPABILITY
When pulled low, the ICT pin forces all digital output
buffers (RCLK, RPDATA, RNDATA, RLOS, RLOL pins) to
be placed in a high output impedance state. This feature
allows in-circuit testing to be done on neighboring devices
without concern for XR-T7295 device buffer damage. An
internal pull-up device (nominally 50kΩ) is provided on
this pin therefore, users can leave this pin unconnected
for normal operation. Test equipment can pull ICT low
during in-circuit testing without damaging the device.
This is the only pin for which internal pull-up/pull-down is
provided.
Rev. 1.05
13