S-8261ABRMD-G3RT2G Datasheet, PDF (13/33 Pages) List of Unclassifed Manufacturers – BATTERY PROTECTION IC FOR 1-CELL PACK

Rev.5.3_00
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8261 Series
(7) S-8261ACD
Table 14
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
t_CU
⎯
0.96 1.2 1.4 s
9
5
Overdischarge detection delay time
t_DL
⎯
232 290 348 ms
9
5
Overcurrent 1 detection delay time
t_lOV1
⎯
14 18 22 ms 10
5
Overcurrent 2 detection delay time
t_lOV2
⎯
1.8 2.24 2.7 ms 10
5
Load short-circuiting detection delay time t_SHORT
⎯
DELAY TIME (Ta = −40°C to +85°C) ^*1
220 320 380 μs 10
5
Overcharge detection delay time
t_CU
⎯
Overdischarge detection delay time
t_DL
⎯
Overcurrent 1 detection delay time
t_lOV1
⎯
Overcurrent 2 detection delay time
t_lOV2
⎯
Load short-circuiting detection delay time t_SHORT
⎯
0.7 1.2 2.0 s
9
5
160 290 493 ms
9
5
10 18 31 ms 10
5
1.2 2.24 3.8 ms 10
5
150 320 540 μs 10
5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design,
not tested in production.
(8) S-8261ACF
Table 15
Test Test
Item
Symbol
Condition
Min. Typ. Max. Unit _{Condition Circuit}
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
t_CU
⎯
0.96 1.2 1.4 s
9
5
Overdischarge detection delay time
t_DL
⎯
115 144 173 ms
9
5
Overcurrent 1 detection delay time
t_lOV1
⎯
14 18 22 ms 10
5
Overcurrent 2 detection delay time
t_lOV2
⎯
1.8 2.24 2.7 ms 10
5
Load short-circuiting detection delay time t_SHORT
⎯
DELAY TIME (Ta = −40°C to +85°C) ^*1
220 320 380 μs 10
5
Overcharge detection delay time
t_CU
⎯
Overdischarge detection delay time
t_DL
⎯
Overcurrent 1 detection delay time
t_lOV1
⎯
Overcurrent 2 detection delay time
t_lOV2
⎯
Load short-circuiting detection delay time t_SHORT
⎯
0.7 1.2 2.0 s
9
5
80 144 245 ms
9
5
10 18 31 ms 10
5
1.2 2.24 3.8 ms 10
5
150 320 540 μs 10
5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design,
not tested in production.
Seiko Instruments Inc.
13