S-8261ABRMD-G3RT2G Datasheet, PDF (11/33 Pages) List of Unclassifed Manufacturers – BATTERY PROTECTION IC FOR 1-CELL PACK

Rev.5.3_00
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8261 Series
(3) S-8261AAT
Table 10
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
t_CU
⎯
Overdischarge detection delay time
t_DL
⎯
Overcurrent 1 detection delay time
t_lOV1
⎯
Overcurrent 2 detection delay time
t_lOV2
⎯
Load short-circuiting detection delay time t_SHORT
⎯
DELAY TIME (Ta = −40°C to +85°C) ^*1
3.7 4.6 5.5 s
9
5
29 36
43 ms
9
5
14 18 22 ms 10
5
7.2
9
11 ms 10
5
220 320 380 μs 10
5
Overcharge detection delay time
t_CU
⎯
Overdischarge detection delay time
t_DL
⎯
Overcurrent 1 detection delay time
t_lOV1
⎯
Overcurrent 2 detection delay time
t_lOV2
⎯
Load short-circuiting detection delay time t_SHORT
⎯
2.5 4.6 7.8 s
9
5
20 36
61 ms
9
5
10 18 31 ms 10
5
5
9
15 ms 10
5
150 320 540 μs 10
5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design,
not tested in production.
(4) S-8261AAU, S-8261AAX, S-8261ABA
Table 11
Test Test
Item
Symbol
Condition
Min. Typ. Max. Unit _{Condition Circuit}
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
t_CU
⎯
Overdischarge detection delay time
t_DL
⎯
Overcurrent 1 detection delay time
t_lOV1
⎯
Overcurrent 2 detection delay time
t_lOV2
⎯
Load short-circuiting detection delay time t_SHORT
⎯
DELAY TIME (Ta = −40°C to +85°C) ^*1
3.7 4.6 5.5 s
9
5
115 144 173 ms
9
5
7.2
9
11 ms 10
5
1.8 2.24 2.7 ms 10
5
220 320 380 μs 10
5
Overcharge detection delay time
t_CU
⎯
Overdischarge detection delay time
t_DL
⎯
Overcurrent 1 detection delay time
t_lOV1
⎯
Overcurrent 2 detection delay time
t_lOV2
⎯
Load short-circuiting detection delay time t_SHORT
⎯
2.5 4.6 7.8 s
9
5
80 144 245 ms
9
5
5
9
15 ms 10
5
1.2 2.24 3.8 ms 10
5
150 320 540 μs 10
5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design,
not tested in production.
Seiko Instruments Inc.
11