5962-90899 Datasheet, PDF (20/27 Pages) List of Unclassifed Manufacturers – MICROCIRCUIT, MEMORY, DIGITAA, CMOS, 128K X 8 BIT FLASH EEPROM, MONOLITHIC SILICON

TABLE IIA. Electrical test requirements. 1/ 2/ 3/ 4/ 5/ 6/ 7/
Line
Test
no.
requirements
1 Interim electrical
parameters
(see 4.2)
2 Static burn-in I
method 1015
3 Same as line 1
4 Dynamic burn-in
(method 1015)
5 Same as line 1
6 Final electrical
parameters
7 Group A test
requirements
8 Group C end-point
electrical
parameters
9 Group D end-point
electrical
parameters
10 Group E end-point
electrical
parameters
Subgroups
(per method
5005, table I)
Device
class
M
Not
required
Required
Subgroups
(per MIL-PRF-38535,
table III)
Device
class
Q
Device
class
V
1,7,9
or
2,8A,10
1,7,9
or
2,8A,10
Not
required
Not
required
1*,7* 
Required
Required
1*,2,3,7*,
8A,8B,9,10,
11
1*,2,3,7*,
8A,8B,9,10,
11
1,2,3,4**,7,8A, 1,2,3,4**,7,
8B,9,10,
8A,8B,9,10,
11
11
2,8A,10
1,2,3,7
8A,8B
2,8A,10
2,3,7
8A,8B
1*,7* 
1*,2,3,7*,
8A,8B,9,10,
11
1,2,3,4**,7,
8A,8B,9,10,
11
1,2,3,7,
8A,8B,9,10,
11 
2,3,7
8A,8B
1,7,9
1,7,9
1,7,9
1/ Blank spaces indicate test are not applicable.
2/ Any or all subgroups may be combined when using high-speed testers.
3/ Subgroups 7 and 8 functional tests shall verify the truth table.
4/ * Indicates PDA applies to subgroups 1 and 7.
5/ ** See 4.4.1c.
6/  Indicates delta limit (see table IIB) shall be required where specified, and the delta values
shall be computed with reference to the previous interim electrical parameters (see line 1).
7/ See 4.4.1e.
4.4.1 Group A inspection.
a. Tests shall be as specified in table IIA herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
C
5962-90899
SHEET
20