WCMA2008U1B Datasheet, PDF (4/11 Pages) List of Unclassifed Manufacturers – 256K x 8 Static RAM

WCMA2008U1B
AC Test Loads and Waveforms
R1
V_CC
OUTPUT
30 pF
R2
INCLUDING
JIG AND
SCOPE
V_CC Typ
10%
GND
Rise Time: 1 V/ns
ALL INPUT PULSES
90%
90%
10%
Fall time: 1 V/ns
Equivalent to:
THÉVENIN EQUIVALENT
OUTPUT
R_TH
V _TH
Parameters
R1
R2
R_TH
V_TH
3.3V
1105
1550
645
1.75
Data Retention Characteristics (Over the Operating Range)
Parameter
V_DR
I_CCDR
t
[3]
CDR
t
[4]
R
Description
V_CC for Data Retention
Data Retention Current
Chip Deselect to Data
Retention Time
Operation Recovery
Time
Conditions
V_CC = 1.5V
CE₁ > V_CC – 0.2V or CE₂ < 0.2V
V_IN > V_CC − 0.2V or V_IN < 0.2V
Min.
1.5
0
t_RC
Data Retention Waveform
V_CC
CE ₁
or
CE₂
V _CC(min)
t_CDR
DATA RETENTION MODE
V_DR > 1.5 V
Unit
Ohms
Ohms
Ohms
Volts
Typ.^[2]
1
Max.
V_ccmax
6
Unit
V
µA
ns
ns
V_CC(min)
t_R
Note:
4. Full Device AC operation requires linear V_CC ramp from V _DR to V_CC(min.) > 100 µs or stable at V _CC(min.) > 100µs.
4