5962-90899 Datasheet, PDF (22/27 Pages) List of Unclassifed Manufacturers – MICROCIRCUIT, MEMORY, DIGITAA, CMOS, 128K X 8 BIT FLASH EEPROM, MONOLITHIC SILICON

TABLE IIB. Delta limits at 25(C.
Test 1/
ICCS2
standby
ILI
ILO
Device types
All
±10 percent of specified value
in table I.
±10 percent of specified value
in table I.
±10 percent of specified value
in table I.
1/ The above parameter shall be recorded before and after
the required burn-in and life tests to determine delta.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness
assured (see 3.5 herein). RHA levels for device classes M, Q, and V shall be as specified in MIL-PRF-38535.
a. End-point electrical parameters shall be as specified in table IIA herein.
b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All
device classes must meet the postirradiation end-point electrical parameter
±5(C, after exposure, to the subgroups specified in table IIA herein.
limits
as
defined
in
table
IA
at
TA
=
+25(C
c. When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate figures and tables as follows.
4.5.1 Erasing procedures. The erasing procedures shall be as specified by the device manufacturer and shall be available
upon request.
4.5.2 Programming procedure. The programming procedures shall be as specified by the device manufacturer and shall be
made available upon request.
4.6 Delta measurements for device class V. Delta measurements, as specified in table IIA, shall be made and recorded
before and after the required burn-in screens and steady-state life tests to determine delta compliance. The electrical
parameters to be measured, with associated delta limits are listed in table IIB. The device manufacturer may, at his option,
either perform delta measurements or within 24 hours after burn-in perform final electrical parameter tests, subgroups 1, 7, and
9.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device
classes Q and V or MIL-PRF-38535, appendix A for device class M.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a
contractor-prepared specification or drawing.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
C
5962-90899
SHEET
22