5962-90899 Datasheet, PDF (10/27 Pages) List of Unclassifed Manufacturers – MICROCIRCUIT, MEMORY, DIGITAA, CMOS, 128K X 8 BIT FLASH EEPROM, MONOLITHIC SILICON

3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain
the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 41 (see MIL-PRF-38535, appendix A).
3.11 Processing of EEPROMs. All testing requirements and quality assurance provisions herein shall be satisfied by the
manufacturer prior to delivery.
3.11.1 Conditions of the supplied devices. Devices will be supplied in an unprogrammed or clear state. No provision will
be made for supplying programmed devices.
3.11.2 Erasure of EEPROMs. When specified, devices shall be erased in accordance with procedures and
characteristics specified in 4.5.1.
3.11.3 Programming of EEPROMs. When specified, devices shall be programmed in accordance with procedures and
characteristics specified in 4.5.2.
3.11.4 Verification of state of EEPROMs. When specified, devices shall be verified as either written to the specified
pattern or cleared. As a minimum, verification shall consist of performing a read of the entire array to verify that all bits are in
the proper state. Any bit that does not verify to be in the proper state shall constitute a device failure and the device shall be
removed from the lot or sample.
3.12 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitors. This
reprogrammability test shall be done for initial characterization and after any design or process changes which may affect the
reprogrammability of the device. The methods and procedures may be vendor specific, but shall guarantee the number of
program/erase endurance cycles listed in section 1.3 herein over the full military temperature range. The vendor's procedure
shall be kept under document control and shall be made available upon request of the acquiring or preparing activity, along
with test data.
3.13 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test
shall be done for initial characterization and after any design or process change which may affect data retention. The
methods and procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein over
the full military temperature range. The vendor's procedure shall be kept under document control and shall be made
available upon request of the acquiring or preparing activity, along with test data.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
C
5962-90899
SHEET
10