CCD47-20 Datasheet, PDF (2/11 Pages) List of Unclassifed Manufacturers – High Performance CCD Sensor

PERFORMANCE
Peak charge storage (see note 1)
Peak output voltage (no binning)
Dark signal at 293 K (see notes 2 and 3)
Dynamic range (see note 4)
Charge transfer efficiency (see note 5):
parallel
serial
Output amplifier responsivity (see note 3)
Readout noise at 243 K (see notes 3 and 6):
grade 0 and 1
grade 2
Maximum readout frequency (see note 7)
Response non-uniformity (std. deviation)
Dark signal non-uniformity (std. deviation)
(see notes 3 and 8)
Min
80k
–
–
–
–
–
3.0
–
–
–
–
–
Typical
120k
540
10k
60 000
99.9999
99.9993
4.5
2.0
3.0
5.0
3
1000
Max
–
–
20k
–
–
–
6.0
4.0
6.0
–
10
2000
e⁷/pixel
mV
e⁷/pixel/s
%
%
mV/e⁷
rms e⁷/pixel
rms e⁷/pixel
MHz
% of mean
e⁷/pixel/s
ELECTRICAL INTERFACE CHARACTERISTICS
Electrode capacitances (measured at mid-clock level)
Min
Typical
Max
S1/S1 interphase
–
3.5
–
nF
I1/I1 interphase
–
3.5
–
nF
I1/SS and S1/SS
–
4.5
–
nF
R1/R1 interphase
–
40
–
pF
R1/(SS+DG+OD)
–
60
–
pF
1R/SS
–
10
–
pF
Output impedance (at typ. operating condition)
–
300
–
O
NOTES
1. Signal level at which resolution begins to degrade.
2. Measured between 233 and 253 K and V_SS +9.0 V. Dark
signal at any temperature T (kelvin) may be estimated from:
Q_d/Q_d0 = 122T³e^76400/T
where Q_d0 is the dark signal at T = 293 K (20 8C).
3. Test carried out at e2v technologies on all sensors.
4. Dynamic range is the ratio of readout noise to full well
capacity measured at 243 K and 20 kHz readout speed.
5. CCD characterisation measurements made using charge
generated by X-ray photons of known energy.
6. Measured using a dual-slope integrator technique (i.e.
correlated double sampling) with a 20 ms integration period.
7. Readout at speeds in excess of 5 MHz into a 15 pF load can
be achieved but performance to the parameters given
cannot be guaranteed.
8. Measured between 233 and 253 K, excluding white defects.
BLEMISH SPECIFICATION
Traps
Pixels where charge is temporarily held.
Traps are counted if they have a capacity
greater than 200 e⁷ at 243 K.
Slipped columns Are counted if they have an amplitude
greater than 200 e⁷.
Black spots
Are counted when they have a signal
level of less than 90% of the local mean
at a signal level of approximately half full-
well.
White spots
White column
Black column
Are counted when they have a genera-
tion rate 25 times the specified maximum
dark signal generation rate (measured
between 233 and 253 K). The amplitude
of white spots will vary in the same
manner as dark current, i.e.:
Q_d/Q_d0 = 122T³e^76400/T
A column which contains at least 21 white
defects.
A column which contains at least 21 black
defects.
GRADE
Column defects:
black or slipped
white
Black spots
Traps 4200 e⁷
White spots
0
1
2
0
2
6
0
0
0
15
25
100
1
2
5
20
30
50
Grade 5
Devices which are fully functioning, with
image quality below that of grade 2, and
which may not meet all other performance
parameters.
Minimum separation between
adjacent black columns . . . . . . . . . 50 pixels
Note The effect of temperature on defects is that traps will be
observed less at higher temperatures but more may appear
below 233 K. The amplitude of white spots and columns will
decrease rapidly with temperature.
CCD47-20, page 2
# e2v technologies