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M12L16161A_08 Datasheet, PDF (4/29 Pages) Elite Semiconductor Memory Technology Inc. – 512K x 16Bit x 2Banks Synchronous DRAM
ESMT
M12L16161A
DC CHARACTERISTICS
(Recommended operating condition unless otherwise noted, TA = 0 to 70 °C VIH(min)/VIL(max)=2.0V/0.8V)
Parameter
Symbol
Test Condition
CAS
Latency
Version
-5
-7
Operating Current
(One Bank Active)
ICC1
Burst Length = 1
tRC ≥ tRC (min), tCC ≥ tCC (min), IOL= 0mA
130
100
Precharge Standby
ICC2P
CKE ≤ VIL(max), tCC =15ns
2
Current in power-down
mode
ICC2PS CKE ≤ VIL(max), CLK ≤ VIL(max), tCC = ∞
2
Precharge Standby
ICC2N
CKE ≥ VIH(min), CS ≥ VIH(min), tCC =15ns
25
Current in non
Input signals are changed one time during 30ns
power-down mode
ICC2NS
CKE ≥ VIH(min), CLK ≤ VIL(max), tCC = ∞
Input signals are stable
10
Active Standby Current ICC3P
CKE ≤ VIL(max), tCC =15ns
10
in power-down mode
ICC3PS CKE ≤ VIL(max), CLK ≤ VIL(max), tCC = ∞
10
Active Standby Current ICC3N
in non power-down
CKE ≥ VIH(min), CS ≥ VIH(min), tCC=15ns
Input signals are changed one time during 30ns
25
mode
(One Bank Active)
ICC3NS
CKE ≥ VIH (min), CLK ≤ VIL(max), tCC= ∞
Input signals are stable
10
Operating Current
(Burst Mode)
IOL= 0Ma, Page Burst
ICC4
All Band Activated, tCCD = tCCD (min)
3
2
150
150
120
120
Refresh Current
ICC5
tRC ≥ tRC(min)
150
120
Self Refresh Current
ICC6
CKE ≤ 0.2V
1
Note: 1.Measured with outputs open. Addresses are changed only one time during tCC(min).
2.Refresh period is 32ms. Addresses are changed only one time during tCC(min).
Unit Note
mA 1
mA
mA
mA
mA
mA
mA
mA 1
mA 2
mA
Elite Semiconductor Memory Technology Inc.
Publication Date : Sep. 2008
Revision : 2.7
4/29