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EN25S10A Datasheet, PDF (55/64 Pages) Eon Silicon Solution Inc. – 1 Megabit 1.8V Serial Flash Memory with 4Kbyte Uniform Sector
Table 14. DC Characteristics
(Ta = - 40°C to 85°C; VCC = 1.65-1.95V)
Symbol
Parameter
Test Conditions
Min.
ILI
ILO
ICC1
ICC2
ICC3
ICC4
ICC5
ICC6
ICC7
VIL
VIH
VOL
VOH
Input Leakage Current
Output Leakage Current
Standby Current
Deep Power-down Current
Operating Current (READ)
Operating Current (PP)
Operating Current (WRSR)
Operating Current (SE)
Operating Current (BE)
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
CS# = VCC, VIN = VSS or
VCC
CS# = VCC, VIN = VSS or
VCC
CLK = 0.1 VCC / 0.9 VCC at
104MHz in Fast Read, DQ =
open
CLK = 0.1 VCC / 0.9 VCC at
33MHz in Fast Read , DQ =
open
CLK = 0.1 VCC / 0.9 VCC at
104MHz in Quad read, DQ =
open
CLK = 0.1 VCC / 0.9 VCC at
33MHz in Quad read, DQ =
open
CS# = VCC
CS# = VCC
CS# = VCC
CS# = VCC
IOL = 100 µA, Vcc=Vcc Min.
IOH = –100 µA , Vcc=Vcc
Min.
– 0.5
0.7VCC
VCC-0.2
EN25S10A
Typ.
Max. Unit
1
±2
µA
1
±2
µA
5
35
µA
5
35
µA
6
12
mA
4
8
mA
9
18
mA
6
12
mA
20
4
5
5
0.8
1
< 0.1
30
mA
8
mA
15
mA
15
mA
0.2 VCC V
VCC+0.4 V
0.3
V
1.8
V
Table 15. AC Measurement Conditions
Symbol
Parameter
CL
Load Capacitance
Input Rise and Fall Times
Input Pulse Voltages
Input Timing Reference Voltages
Output Timing Reference Voltages
Min.
Max.
30
5
0.2VCC to 0.8VCC
0.3VCC to 0.7VCC
VCC / 2
Unit
pF
ns
V
V
V
Figure 39. AC Measurement I/O Waveform
This Data Sheet may be revised by subsequent versions
55
or modifications due to changes in technical specifications.
©2014 Eon Silicon Solution, Inc.,
Rev. A, Issue Date: 2014/01/20
www.eonssi.com