EN29LV160B Datasheet, PDF (27/43 Pages) Eon Silicon Solution Inc. – 16 Megabit (2048K x 8-bit / 1024K x 16-bit) Flash Memory

Test Conditions
EN29LV160B
Test Specifications
Test Conditions
Output
Load
Capacitance,
C_LB
B
Input Rise and Fall times
Input Pulse Levels
Input timing measurement
reference levels
Output timing measurement
reference levels
-70
Unit
30
pF
5
ns
0.0-3.0
V
1.5
V
1.5
V
This Data Sheet may be revised by subsequent versions
27
or modifications due to changes in technical specifications.
© 2004 Eon Silicon Solution, Inc.,
Rev. I, Issue Date: 2011/10/26
www.eonssi.com