3D6701 Datasheet, PDF (4/4 Pages) Data Delay Devices, Inc. – MONOLITHIC CLOCK SYNCHRONIZER (SERIES 3D6701)

3D6701
SILICON DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
Ambient Temperature: 25^oC  3^oC
Supply Voltage (Vcc): 5.0V  0.1V
Input Pulse:
High = 3.0V  0.1V
Low = 0.0V  0.1V
Source Impedance: 50 Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6 and 2.4V)
OUTPUT:
R_load:
C_load:
Threshold:
10K  10%
5pf  10%
1.5V (Rising & Falling)
Device
Under
Test
10K
470
Digital
Scope
5pf
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
COMPUTER
SYSTEM
PRINTER
PULSE
OUT
GENERATOR
TRIG
FREQ SOURCE
G_{IN DEVICE UNDER} FOUT
F_IN
TEST (DUT)
REF
IN
FREQUENCY/
TIME INTERVAL COUNTER
TRIG
Figure 3: Test Setup
T_RISE
2.4V
V_IH
G_IN
1.5V
0.6V
D_INH
1/F_OSC
F_OUT ^1.5V
1.5V
T_FALL
2.4V
1.5V
0.6V
V_IL
T_RES
1.5V
Figure 4: Timing Diagram
Doc #14015
DATA DELAY DEVICES, INC.
4
6/9/2014
Tel: [phone] Fax: [phone] http://www.datadelay.com