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DS1646 Datasheet, PDF (7/11 Pages) Dallas Semiconductor – Nonvolatile Timekeeping RAM
AC ELECTRICAL CHARACTERISTICS
PARAMETER
SYMBOL
Read Cycle Time
tRC
Address Access Time
tAA
CE Access Time
tCEA
CE Data Off Time
tCEZ
Output Enable Access Time
tOEA
Output Enable Data Off Time
tOEZ
Output Enable to DQ Low-Z
tOEL
CE to DQ Low-Z
tCEL
Output Hold from Address
tOH
Write Cycle Time
tWC
Address Setup Time
tAS
CE Pulse Width
tCEW
Address Hold from End of Write
Write Pulse Width
WE Data Off Time
tAH1
tAH2
tWEW
tWEZ
WE or CE Inactive Time
tWR
Data Setup Time
tDS
Data Hold Time High
tDH1
tDH2
MIN
120
5
5
5
120
0
100
5
30
75
10
85
0
25
AC TEST CONDITIONS
Input Levels:
0V to 3V
Transition Times: 5 ns
DS1646/DS1646P
(Over the Operating Range)
TYP
MAX
120
120
UNITS
ns
ns
ns
NOTES
40
ns
100
ns
40
ns
ns
ns
ns
ns
ns
ns
ns
5
ns
6
ns
40
ns
ns
ns
ns
5
ns
6
CAPACITANCE
PARAMETER
Capacitance on all pins (except DQ)
Capacitance on DQ pins
SYMBOL
CI
CDQ
MIN
TYP
MAX
7
10
(tA = 25°C)
UNITS NOTES
pF
pF
AC ELECTRICAL CHARACTERISTICS
(POWER-UP/DOWN TIMING)
PARAMETER
SYMBOL
CE or WE at VIH before Power-Down
tPD
VPF (Max) to VPF (Min) VCC Fall Time
tF
VPF (Min) to VSO VCC Fall Time
tFB
VSO to VPF (Min) VCC Rise Time
tRB
VPF (Min) to VPF (Max) VCC Rise Time
tR
Power-Up
tREC
Expected Data Retention Time
tDR
(Oscillator On)
MIN
0
300
10
1
0
15
10
(Over the Operating Range)
TYP MAX UNITS NOTES
µs
µs
µs
µs
µs
35
ms
years
4
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