CAT28C17A_04 Datasheet, PDF (3/10 Pages) Catalyst Semiconductor – 16K-Bit CMOS PARALLEL EEPROM

CAT28C17A
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –55°C to +125°C
Storage Temperature ....................... –65°C to +150°C
Voltage on Any Pin with
Respect to Ground⁽²⁾ ........... –2.0V to +VCC + 2.0V
VCC with Respect to Ground ............... –2.0V to +7.0V
Package Power Dissipation
Capability (Ta = 25°C) ................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300°C
Output Short Circuit Current⁽³⁾ ........................ 100 mA
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation
of the device at these or any other conditions outside of
those listed in the operational sections of this specifica-
tion is not implied. Exposure to any absolute maximum
rating for extended periods may affect device perfor-
mance and reliability.
RELIABILITY CHARACTERISTICS
Symbol
N_END(1)
T_DR(1)
V_ZAP(1)
I_LTH(1)(4)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Min.
10,000
10
2000
100
Max.
Units
Cycles/Byte
Years
Volts
mA
Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
D.C. OPERATING CHARACTERISTICS
V_CC = 5V ±10%, unless otherwise specified.
Symbol
I_CC
I_CCC(5)
I_SB
I_SBC(6)
I_LI
I_LO
V_IH(6)
V_IL(5)
V_OH
V_OL
V_WI
Parameter
V_CC Current (Operating, TTL)
V_CC Current (Operating, CMOS)
V_CC Current (Standby, TTL)
V_CC Current (Standby, CMOS)
Input Leakage Current
Output Leakage Current
High Level Input Voltage
Low Level Input Voltage
High Level Output Voltage
Low Level Output Voltage
Write Inhibit Voltage
Limits
Min. Typ.
Max.
35
Units
mA
25
mA
1
mA
100 µA
–10
10
µA
–10
10
µA
2
V_CC +0.3 V
–0.3
0.8
V
2.4
V
0.4
V
3.0
V
Test Conditions
CE = OE = V_IL,
f = 1/t_RC min, All I/O’s Open
CE = OE = V_ILC,
f = 1/t_RC min, All I/O’s Open
CE = V_IH, All I/O’s Open
CE = V_IHC,
All I/O’s Open
V_IN = GND to V_CC
V_OUT = GND to V_CC,
CE = V_IH
I_OH = –400µA
I_OL = 2.1mA
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V_CC +0.5V, which may overshoot to V_CC +2.0V for periods of less than 20 ns.
(3) Output shorted for no more than one second. No more than one output shorted at a time.
(4) Latch-up protection is provided for stresses up to 100mA on address and data pins from –1V to V_CC +1V.
(5) V_ILC = –0.3V to +0.3V.
(6) V_IHC = V_CC –0.3V to V_CC +0.3V.
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Doc. No. 1075, Rev. B