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CAT93C76_07 Datasheet, PDF (2/13 Pages) Catalyst Semiconductor – 8K-Bit Microwire Serial EEPROM
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CAT93C76 (Rev. A)
ABSOLUTE MAXIMUM RATINGS(1)
Parameters
Temperature Under Bias
Storage Temperature
Voltage on any Pin with Respect to Ground(2)
VCC with Respect to Ground
Lead Soldering Temperature (10 seconds)
Output Short Circuit Current(3)
Ratings
–55 to +125
–65 to 150
-2.0 to +VCC +2.0
-2.0 to +7.0
300
100
Units
ºC
ºC
V
V
ºC
mA
RELIABILITY CHARACTERISTICS(3)
Symbol
NEND(4)
TDR(4)
VZAP(4)
ILTH(4)(5)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
Min
1,000,000
100
2000
100
Units
Cycles/Byte
Years
V
mA
D.C. OPERATING CHARACTERISTICS
VCC = +1.8V to +5.5V unless otherwise specified.
Symbol
Parameter
Test Conditions
Min Typ Max Units
ICC1
Power Supply Current (Write) fSK = 1MHz; VCC = 5.0V
1
3
mA
ICC2
Power Supply Current (Read) fSK = 1MHz; VCC = 5.0V
ISB1
Power Supply Current
(Standby) (x8 Mode)
CS = 0V ORG = GND
ISB2
Power Supply Current
(Standby) (x16Mode)
CS = 0V ORG = Float or VCC
ILI
Input Leakage Current
VIN = 0V to VCC
ILO
Output Leakage Current
VOUT = 0V to VCC, CS = 0V
300
500
µA
2
10
µA
0(6)
10
µA
0(6)
10
µA
0(6)
10
µA
ILORG ORG Pin Leakage Current
ORG = GND or ORG = VCC
1
10
µA
VIL1 Input Low Voltage
4.5V ≤ VCC ≤ 5.5V
-0.1
0.8
V
VIH1 Input High Voltage
4.5V ≤ VCC ≤ 5.5V
2
VCC + 1
V
VIL2 Input Low Voltage
1.8V ≤ VCC < 4.5V
0
VCC x 0.2
V
VIH2 Input High Voltage
1.8V ≤ VCC < 4.5V
VCC x 0.7
VCC + 1
V
VOL1 Output Low Voltage
4.5V ≤ VCC ≤ 5.5V; IOL = 2.1mA
0.4
V
VOH1 Output High Voltage
4.5V ≤ VCC ≤ 5.5V; IOH = -400µA
2.4
V
VOL2 Output Low Voltage
1.8V ≤ VCC < 4.5V; IOL = 100µA
0.1
V
VOH2 Output High Voltage
1.8V ≤ VCC < 4.5V; IOH = -100µA VCC - 0.2
V
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20ns. Maximum DC
voltage on output pins is VCC +0.5V, which may overshoot to VCC +2.0V for periods of less than 20ns.
(3) Output shorted for no more than one second.
(4) These parameters are tested initially and after a design or process change that affects the parameter.
(5) Latch-up protection is provided for stresses up to 100 mA on I/O pins from –1V to VCC +1V.
(6) 0µA is defined as less than 900nA.
Doc. No. MD-1090 Rev. B
2
© Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
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