CAT25C33_05 Datasheet, PDF (2/11 Pages) Catalyst Semiconductor – 32K/64K-Bit SPI Serial CMOS EEPROM

CAT25C33/65
ABSOLUTE MAXIMUM RATINGS*
*COMMENT
Temperature Under Bias ................. –55°C to +125°C Stresses above those listed under “Absolute Maximum
Storage Temperature ....................... –65°C to +150°C
Voltage on any Pin with
Respect to VSS1) ................... –2.0V to +VCC +2.0V
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation
of the device at these or any other conditions outside of
those listed in the operational sections of this specifica-
VCC with Respect to VSS ................................ –2.0V to +7.0V
tion is not implied. Exposure to any absolute maximum
rating for extended periods may affect device perfor-
Package Power Dissipation
mance and reliability.
Capability (Ta = 25°C) ................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300°C
Output Short Circuit Current⁽²⁾ ........................ 100 mA
ts RELIABILITY CHARACTERISTICS
r ^Symbol
Parameter
NEND(3)
a _TDR(3)
V_ZAP(3)
P _ILTH(3)(4)
Endurance
Data Retention
ESD Susceptibility
Latch-up
Min.
1,000,000
100
2000
100
Typ.
Max.
Units
Cycles/Byte
Years
Volts
mA
d ^{D.C. OPERATING CHARACTERISTICS}
V_CC = +1.8V to +6.0V, unless otherwise specified.
e _Symbol
u _ICC1
tin ^ICC2
I_SB(5)
n ILI
ILO
Parameter
Power Supply Current
(Operating Write)
Power Supply Current
(Operating Read)
Power Supply Current
(Standby)
Input Leakage Current
Output Leakage Current
Min.
Limits
Typ.
Max.
10
2
1
2
3
o _VIL(3)
c V_IH(3)
V_OL1
is ^VOH1
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
-1
V_CC x 0.7
V_CC - 0.8
V_CC x 0.3
V_CC + 0.5
0.4
VOL2
Output Low Voltage
0.2
DVOH2
Output High Voltage
VCC-0.2
Units
mA
mA
µA
µA
µA
V
V
V
V
V
V
Test Conditions
VCC = 5V @ 10MHz
SO=open; CS=Vss
V_CC = 5.0V
FCLK = 10MHz
CS = V_CC
VIN = VSS or VCC
VOUT = 0V to VCC,
CS = 0V
4.5V≤V_CC<5.5V
I_OL = 3.0mA
I_OH = -1.6mA
1.8V≤VCC<2.7V
IOL = 150µA
I_OH = -100µA
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V_CC +0.5V, which may overshoot to V_CC +2.0V for periods of less than 20 ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) These parameter are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100
and JEDEC test methods.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V_CC +1V.
(5) Maximum standby current (I_SB ) = 10µA for the Automotive and Extended Automotive temperature range.
Doc. No. 1000, Rev. H
2
© 2005 by Catalyst Semiconductor, Inc.
Characteristics subject to change without notice