CAT24WC08W Datasheet, PDF (2/14 Pages) Catalyst Semiconductor – Serial EEPROM

CAT24WC01/02/04/08/16
ABSOLUTE MAXIMUM RATINGS*
*COMMENT
Temperature Under Bias ................. –55°C to +125°C
Storage Temperature ....................... –65°C to +150°C
Voltage on Any Pin with
Respect to Ground⁽¹⁾ ........... –2.0V to +V_CC + 2.0V
VCC with Respect to Ground ............... –2.0V to +7.0V
Package Power Dissipation
Capability (Ta = 25°C) ................................... 1.0W
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
Lead Soldering Temperature (10 secs) ............ 300°C
Output Short Circuit Current⁽²⁾ ........................ 100mA
RELIABILITY CHARACTERISTICS
ts ^Symbol
Parameter
r ^NEND(3)
TDR(3)
a _VZAP(3)
I_LTH(3)(4)
Endurance
Data Retention
ESD Susceptibility
Latch-up
Min.
1,000,000
100
2000
100
Max.
Units
Cycles/Byte
Years
Volts
mA
P _{D.C. OPERATING CHARACTERISTICS}
ed ^{VCC = +1.8V to +5.5V, unless otherwise specified.}
Limits
Symbol
Parameter
Min.
Typ.
u _ICC
tin ^ISB(5)
Power Supply Current
Standby Current (V_CC = 5.0V)
I_LI
Input Leakage Current
I_LO
Output Leakage Current
n ^VIL
Input Low Voltage
–1
VIH
Input High Voltage
VCC x 0.7
o _{VOL1 Output Low Voltage (VCC = 3.0V)}
c ^{VOL2 Output Low Voltage (VCC = 1.8V)}
Max.
3
1
10
10
VCC x 0.3
VCC + 0.5
0.4
0.5
Units
mA
µA
µA
µA
V
V
V
V
Test Conditions
f_SCL = 100 KHz
V_IN = GND or V_CC
V_IN = GND to V_CC
V_OUT = GND to V_CC
I_OL = 3 mA
I_OL = 1.5 mA
is ^{CAPACITANCE TA = 25°C, f = 1.0 MHz, VCC = 5V}
Symbol
Test
DC_I/O(3) Input/Output Capacitance (SDA)
Max.
8
Units
pF
Conditions
VI/O = 0V
C_IN(3) Input Capacitance (A0, A1, A2, SCL, WP)
6
pF
V_IN = 0V
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V_CC +0.5V, which may overshoot to V_CC + 2.0V for periods of less than 20ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100
and JEDEC test methods.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V_CC +1V.
(5) Maximum standby current (I_SB ) = 10µA for the Automotive and Extended Automotive temperature range.
Doc. No. 1022, Rev. O
© Catalyst Semiconductor, Inc.
2
Characteristics subject to change without notice