HCPL-0708-560E Datasheet, PDF (8/12 Pages) AVAGO TECHNOLOGIES LIMITED – High Speed CMOS Optocoupler

Package Characteristics
All Typicals at T_A = 25°C.
Parameter
Symbol
Min. Typ. Max. Units
Test Conditions
Input-Output Insulation
I_I-O
1
µA


45% RH, t = 5 s
V_I-O = 3 kV dc,
T_A = 25°C
Input-Output Momentary
V_ISO
3750
Vrms
Withstand Voltage
RH ≤ 50%, t = 1 min.,
T_A = 25°C
Input-Output Resistance
R_I-O
10¹²
Ω
V_I-O = 500 V dc
Input-Output Capacitance
C_I-O
0.6
pF
f = 1 MHz, T_A = 25°C
Notes:
  1. t_PHL propagation delay is measured from the 50% level on the risiing edge of the input pulse to the 2.5 V level of the falling edge of the V_O
signal. t_PLH propagation delay is measured from the 50% level on the falling edge of the input pulse to the 2.5 V level of the rising edge of the
V_O signal.
  2. PWD is defined as |t_PHL - t_PLH|.
  3. t_PSK is equal to the magnitude of the worst case difference in t_PHL and/or t_PLH that will be seen between units at any given temperature within
the recommended operating conditions.
  4. CM_H is the maximum tolerable rate of rise of the common mode voltage to assure that the output will remain in a high logic state.
  5. CM_L is the maximum tolerable rate of fall of the common mode voltage to assure that the output will remain in a low logic state.