PS-AT7909E Datasheet, PDF (9/20 Pages) ATMEL Corporation – MICROCIRCUIT, DIGITAL, CMOS, MONOLITHIC SILICON SINGLE CHIP TELEMETRY AND TELECOMMAND AT7909E

PS-AT7909E
Rev A
Propagation Delay
SysClk to SpwDOut?
Tp3
Propagation Delay
SysClk to SpwDOut?
Tp4
Propagation Delay
SysClk to SpwSOut?
Tp5
Propagation Delay
SysClk to SpwSOut?
Tp6
Propagation Delay
SysClk to SeqIrq
Tp7
3003
3003
3003
3003
3003
VDD = 3.6 V
Note 2
VDD = 3.6 V
Note 2
VDD = 3.6 V
Note 2
VDD = 3.6 V
Note 2
VDD = 3.6 V
Note 2
41
ns
34
ns
41
ns
34
ns
53
ns
Notes :
1/ Guaranteed but not tested
2/ Test conditions: Tester load 80 pF, VIL = 0V, VIH = VDD, Input signals dynamic characteristics: tr,tf < 10ns,
Threshold voltages: VOL = VOH = VDD/2
TABLE 2. Parameter drift values
Test
Low Level Input
Current
High Level Input
Current
Output Leakage Low
Current
Output Leakage High
Current
Supply Current Stand-
by for Array
Low Level Output
Voltage BUF2
High Level Output
Voltage BUF2
Symbol
IIL
IIH
IOZL
IOZH
IDDSBA
VOL
VOH
Test
method
Mil-Std-
883
3009
Conditions
as per Table 1
3010
as per Table 1
-
as per Table 1
-
as per Table 1
3005
as per Table 1
3007
as per Table 1
3006
as per Table 1
Drift
limits
Unit
±0.1 µA
±0.1 µA
±0.1 µA
±0.1 µA
430
µA
±100 mV
±100 mV
Note : the above parameter shall be recorded before and after burn-in and life test to determine the delta.
Sheet 9 / 20