PS-AT7909E Datasheet, PDF (6/20 Pages) ATMEL Corporation – MICROCIRCUIT, DIGITAL, CMOS, MONOLITHIC SILICON SINGLE CHIP TELEMETRY AND TELECOMMAND AT7909E

PS-AT7909E
Rev A
3.4.2
Parameters drift value
For space application, the parameter drift values applicable to burn-in are specified in Table 2 of
this specification. Unless otherwise stated, measurements shall be performed at + 25 + 3 ° C. The
parameter drift values (∆), applicable to the parameters scheduled, shall not be exceeded.
In addition to these drift value requirements, the appropriate limit value specified for a given
parameter in Table 1 shall not be exceeded.
.
3.5 Environmental and Endurance Tests
3.5.1
Electrical Circuit for Operating LifeTest
The circuit for operating life testing shall be as specified for power burn in (figure 4).
3.5.2
Electrical Measurements at Completion of Environmental and endurance tests
The parameters to be measured are scheduled in Table 1. Unless otherwise stated, the
measurements shall be performed at tamb = 25+3°C.
3.5.3
Conditions for Operating LifeTest
The conditions for operating life testing shall be as specified for power burn in.
4
QUALITY ASSURANCE PROVISIONS
4.1 Wafer lot acceptance test
For space application, Wafer Lot Acceptance shall be performed according to mil-std-883 method
5007.
4.2 Sampling and inspection.
Sampling and inspection procedures shall be in accordance with MIL-PRF-38535.
4.3 Screening.
Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior
to qualification and technology conformance inspection
• The burn-in test duration, test condition and test temperature, or approved alternatives shall be as
specified in accordance with MIL-PRF-38535.
• Additional screening for space application devices shall be as specified in MIL-PRF-38535, appendix B.
4.4 Quality conformance inspection
Qualification inspection for high reliability and space applications devices shall be in accordance
with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for
groups A, B, C, D, and E inspections.
4.4.1
Group A inspection.
• Tests shall be as specified in table 1 herein.
• Subgroups 5 and 6 of table I of method 5005 of MIL STD 883 shall be omitted.
• Subgroups 7 and 8 of table I of method 5005 of MIL STD 883 shall include verifying the functionality of the
device.
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