PS-AT7909E Datasheet, PDF (7/20 Pages) ATMEL Corporation – MICROCIRCUIT, DIGITAL, CMOS, MONOLITHIC SILICON SINGLE CHIP TELEMETRY AND TELECOMMAND AT7909E

PS-AT7909E
Rev A
• O/V (latch up) tests shall be measured only for the initial qualification and after any process or design
changes which may affect the performance of the device.
• Capacitance measurement shall be measured only for initial qualification and after any process or design
changes which may affect input or output capacitance. Capacitance shall be measured between the
designated terminal and GND at a frequency of 1 MHz. Sample size is five devices with no failure, and all
input and output terminals tested.
4.4.2
Group C inspection.
The group C inspection end-point electrical parameters shall be as specified in table 1 herein.
4.4.3
Group D inspection.
The group D inspection end-point electrical parameters shall be as specified in table 1 herein.
4.5 Delta measurements
Delta measurements, as specified in table 2, shall be made and recorded before and after the required
burn-in screens and steady-state life tests to determine delta compliance. The electrical parameters to be
measured, with associated delta limits are listed in table 2. The device manufacturer may, at his option,
either perform delta measurements or within 24 hours after life test perform final electrical parameter tests,
subgroups 1, 7 and 9.
5 PACKAGING
5.1 Packaging requirements
The requirements for packaging shall be in accordance with MIL-PRF-38535.
Sheet 7 / 20