CC2530F32 Datasheet, PDF (8/31 Pages) Aplus Intergrated Circuits – A True System-on-Chip Solution for 2.4-GHz IEEE 802.15.4 and ZigBee Applications

CC2530F32, CC2530F64, CC2530F128, CC2530F256
SWRS081A – APRIL 2009 – REVISED APRIL 2009 .......................................................................................................................................................... www.ti.com
16-MHz RC OSCILLATOR
Measured on Texas Instruments CC2530 EM reference design with T_A = 25°C and VDD = 3 V, unless otherwise noted.
PARAMETER
Frequency ⁽¹⁾
TEST CONDITIONS
MIN TYP MAX UNIT
16
MHz
Uncalibrated frequency accuracy
±18%
Calibrated frequency accuracy
±0.6% ±1%
Start-up time
Initial calibration time⁽²⁾
10 µs
50
µs
(1) The calibrated 16-MHz RC oscillator frequency is the 32-MHz XTAL frequency divided by 2.
(2) When the 16-MHz RC oscillator is enabled, it is calibrated when a switch from the 16-MHz RC oscillator to the 32-MHz crystal oscillator
is performed while SLEEPCMD.OSC_PD is set to 0.
RSSI/CCA CHARACTERISTICS
Measured on Texas Instruments CC2530 EM reference design with T_A = 25°C and VDD = 3 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN TYP
MAX UNIT
RSSI range
100
dB
Absolute uncalibrated RSSI/CCA accuracy
RSSI/CCA offset⁽¹⁾
±4
dB
73
dB
Step size (LSB value)
1
dB
(1) Real RSSI = Register value – offset
FREQEST CHARACTERISTICS
Measured on Texas Instruments CC2530 EM reference design with T_A = 25°C and VDD = 3 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
FREQEST range
±250
kHz
FREQEST accuracy
FREQEST offset⁽¹⁾
±40
kHz
20
kHz
Step size (LSB value)
7.8
kHz
(1) Real FREQEST = Register value – offset
FREQUENCY SYNTHESIZER CHARACTERISTICS
Measured on Texas Instruments CC2530 EM reference design with T_A = 25°C, VDD = 3 V and f_c = 2440 MHz, unless
otherwise noted.
PARAMETER
Phase noise, unmodulated carrier
TEST CONDITIONS
At ±1-MHz offset from carrier
At ±2-MHz offset from carrier
At ±5-MHz offset from carrier
MIN TYP MAX UNIT
–110
–117
dBc/Hz
–122
ANALOG TEMPERATURE SENSOR
Measured on Texas Instruments CC2530 EM reference design with T_A = 25°C and VDD = 3 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN TYP MAX
UNIT
Output at 25°C
1480
12-bit ADC
Temperature coefficient
4.5
/10°C
Voltage coefficient
Initial accuracy without calibration
Accuracy using 1-point calibration (entire
temperature range)
Measured using integrated ADC using
internal bandgap voltage reference and
maximum resolution
1
/0.1 V
±10
°C
±5
°C
Current consumption when enabled (ADC
current not included)
0.5
mA
8
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