HY62WT08081E Datasheet, PDF (7/13 Pages) Hynix Semiconductor – HY62WT08081E Series 32Kx8bit CMOS SRAM

HY62WT08081E Series
AC TEST CONDITIONS
TA = 0°C to 70°C (Normal) / -25°C to 85°C (Extended) / -40°C to 85°C (Industrial)
unless otherwise specified.
Parameter
Value
Input Pulse Level
Vcc = 4.5~5.5V
0.8V to 2.4V
Vcc = 2.7~3.6V
0.4V to 2.2V
Input Rise and Fall Time
5ns
Input and Output Timing Reference Level
1.5V
Output Load
tCLZ,tOLZ,tCHZ,tOHZ,tWHZ,tOW
CL = 5pF + 1TTL Load
Others
CL = 100pF + 1TTL Load
CL* = 30pF + 1TTL Load
AC TEST LOADS
TTL
CL(1)
Note : Including jig and scope capacitance
CAPACITANCE
TA = 25°C, f = 1.0MHz
Symbol
Parameter
CIN
Input Capacitance
CI/O Input /Output Capacitance
Condition
VIN = 0V
VI/O = 0V
Max.
6
8
Unit
pF
pF
Note : These parameters are sampled and not 100% tested
Rev 04 / May. 2001
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