N256S08XXHDA Datasheet, PDF (4/15 Pages) AMI SEMICONDUCTOR – 256Kb Low Power Serial SRAMs 32K × 8 bit Organization

AMI Semiconductor, Inc.
Timing Test Conditions
Item
Input Pulse Level
Input Rise and Fall Time
Input and Output Timing Reference Levels
Output Load
Operating Temperature
Timing
Item
Clock Frequency
Clock Rise Time
Clock Fall Time
Clock High Time
Clock Low Time
Clock Delay Time
CS Setup Time
CS Hold Time
CS Disable Time
SCK to CS
Data Setup Time
Data Hold Time
Output Valid From Clock Low
Output Hold Time
Output Disable Time
HOLD Setup Time
HOLD Hold Time
HOLD Low to Output High-Z
HOLD High to Output Valid
Symbol
f_CLK
t_R
t_F
t_HI
t_LO
t_CLD
t_CSS
t_CSH
t_CSD
t_SCS
t_SU
t_HD
t_V
t_HO
t_DIS
t_HS
t_HH
t_HZ
t_HV
N256S0818HDA/N256S0830HDA
Advance Information
0.1V_CC to 0.9 V_CC
5ns
0.5 V_CC
CL = 100pF
-40 to +85 ^oC
1.8V Device
Min.
Max.
20
2
2
25
25
25
25
50
25
5
10
10
25
0
20
10
10
10
50
3V Device
Min.
Max.
25
2
2
20
20
20
20
40
20
5
10
10
20
0
15
10
10
10
40
Units
MHz
us
us
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
4
This is a developmental specification and is subject to change without notice.