PALCE20V8 Datasheet, PDF (15/16 Pages) Advanced Micro Devices – EE CMOS 24-Pin Universal Programmable Array Logic

ENDURANCE CHARACTERISTICS
The PALCE20V8 is manufactured using AMD’s ad-
vanced electrically erasable process. This technology
Endurance Characteristics
AMD
uses an EE cell to replace the fuse link used in bipolar
parts. As a result, the device can be erased and
reprogrammed—a feature which allows 100% testing at
the factory.
Symbol Parameter
tDR Min Pattern Data Retention Time
N
Min Reprogramming Cycles
Test Conditions
Max Storage Temperature
Max Operating Temperature
Normal Programming Conditions
Min
Unit
10
Years
20
Years
100
Cycles
PALCE20V8 Family
2-179