English
Language : 

CN-0294 Datasheet, PDF (1/5 Pages) Analog Devices – Increasing the Number of Outputs from a Clock Source Using Low Jitter LVPECL Fanout Buffers
Circuit Note
CN-0294
Circuits from the Lab™ reference circuits are engineered and
tested for quick and easy system integration to help solve today’s
analog, mixed-signal, and RF design challenges. For more
information and/or support, visit www.analog.com/CN0294.
Devices Connected/Referenced
ADF4351
Fractional-N PLL Synthesizer with
Integrated VCO
ADCLK948
Clock Fanout Buffer with 8 LVPECL
Outputs
Increasing the Number of Outputs from a Clock Source Using Low Jitter LVPECL
Fanout Buffers
EVALUATION AND DESIGN SUPPORT
Circuit Evaluation Boards
ADF4351 Evaluation Board (EVAL-ADF4351EB1Z)
ADCLK948 Evaluation Board (ADCLK948/PCBZ)
Design and Integration Files
Schematics, Layout Files, Bill of Materials
CIRCUIT FUNCTION AND BENEFITS
Many systems require low jitter multiple system clocks for mixed
signal processing and timing. The circuit shown in Figure 1
interfaces the ADF4351 integrated phase-locked loop (PLL)
and voltage-controlled oscillator (VCO) to the ADCLK948,
which provides up to eight differential, low voltage, positive
emitter coupled logic (LVPECL) outputs from one differential
output of the ADF4351.
3.3V
3.3V
ADCLK948
VVCO
3.3V
1µF
VDD
FREFIN
16 17 28 10 4 26 6 32
1nF 1nF
VVCO
29 REFIN
51Ω
1 CLK
2 DATA
3 LE
DVDD AVDD CE PDBRF VP SDVDD
RFOUTB+ 14 VVCO
RFOUTB– 15
ZBIAS
ADF4351
RFOUTA+ 12
4.7kΩ
22 RSET
RFOUTA– 13
VTUNE 20
CPOUT 7
SW 5
CPGND SDGND AGND AGNDVCO DGND
8
31 9 11 18 21 27
22nF
3.3V
VREF0
ZBIAS
1nF
1nF
100Ω 100Ω VT0
CLK0
CLK0
100Ω 100Ω VT1
180Ω
330nF
82Ω
10nF
CLK1
CLK1
IN_SEL
VREF1
REFERENCE
REFERENCE
LVPECL
Q0
Q0
Q1
Q1
Q2
Q2
Q3
Q3
Q4
Q4
Q5
Q5
Q6
Q6
Q7
Q7
Figure 1. ADF4351 PLL Connected to ADCLK948 Fanout Buffer (Simplified Schematic: All Connections and Decoupling Not Shown)
Rev. 0
Circuits from the Lab™ circuits from Analog Devices have been designed and built by Analog Devices
engineers. Standard engineering practices have been employed in the design and construction of
each circuit, and their function and performance have been tested and verified in a lab environment at
room temperature. However, you are solely responsible for testing the circuit and determining its
suitability and applicability for your use and application. Accordingly, in no event shall Analog Devices
be liable for direct, indirect, special, incidental, consequential or punitive damages due to any cause
whatsoever connected to the use of any Circuits from the Lab circuits. (Continued on last page)
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2012 Analog Devices, Inc. All rights reserved.