MA3864 Datasheet, PDF (4/11 Pages) Zarlink Semiconductor Inc – RADIATION HARD 8192 x 8 BIT MASK-PROGRAMMABLE ROM

MA3864
AC CHARACTERISTICS
Conditions of Test for Table 5:
1. Input pulse = V_SS to 4.5V.
2. Times measurement reference level = 1.5V.
3. Input Rise and Fall times ≤5ns.
4. Output load 1TTL gate and CL = 60pF.
5. Transition is measured at ±500mV from steady state (T_ELQX, T_EHQZ, T_GHQZ).
6. These parameters are sampled and not 100% tested (T_ELQX, T_EHQZ, T_GHQZ).
Characteristics apply to pre-radiation at T_A = -55°C to +125°C with V_DD = 5V±10% and to post 100k Rad(Si) total dose radiation
at T_A = 25°C with V_DD = 5V ±10%. GROUP A SUBGROUPS 9, 10, 11.
Symbol
Parameter
Min Max Units
T_AVAX
T
AVQV
*T_ELQV
T_GLQV
T_AXQX
*T_ELQX
*T_EHQZ
T_GHQZ
T_ELEH
Read Cycle Time
Address Access Time
Chip Select Access Time
Output Enable to Output Valid
Output Hold Time for Address Access
Chip Select Low to Outputs Active
Chip Select High to Outputs Hi-Z
Output Enable High to Output Hi-Z
Chip Select Pulse Width
60 -
ns
- 60 ns
- 60 ns
- 15 ns
15 -
ns
- 30 ns
- 30 ns
- 10 ns
60 -
ns
*These functions refer to the action of the internal chip select, E. The timings given are relative to
the last of the pins; E1, E2, E3 and E4 to change which causes the specified transitions of E.
Figure 5: Read Cycle AC Electrical Characteristics
Symbol Parameter
Conditions
Min.
Typ.
Max. Units
C_IN
C_OUT
Input Capacitance
Output Capacitance
V_l = 0V
V_I/O = 0V
-
3
5
pF
-
5
7
pF
Note: T_A = 25°C and f = 1MHz. Data obtained by characterisation or analysis; not routinely measured.
Figure 6: Capacitance
3