W45B012 Datasheet, PDF (6/16 Pages) Winbond – 1M x 1 SERIAL FLASH MEMORY

Preliminary W45B012
CAPACITANCE
(VDD = 2.7V ~ 3.6V, TA = 25_° C, f = 1 MHz)
PARAMETER
SYMBOL
Output Pin Capacitance
COUT1
Input Pin Capacitance
CIN1
CONDITIONS
VDQ = 0V
VIN = 0V
MAX.
12
6
AC CHARACTERISTICS
AC Test Conditions
(VDD = 2.7V _− 3.6V)
PARAMETER
Input Rise/Fall Time
Input/Output Timing Level
Output Load
AC Test Load and Waveform
CONDITIONS
<5 nS
0.5 VDD / 0.5 VDD
CL = 30 pF
UNIT
pF
pF
CL =30pF
VIHT
V
ILT
INPUT
VIT _{REFERENCE POINTS} ^VOT
OUTPUT
AC test inputs are driven at VIHT (0.9 VDD) for a logic "1" and VILT (0.1 VDD) for a logic "0". Measurement reference points
for inputs and outputs are at VIT (0.5 VDD) and VOT (0.5 VDD) Input rise and fall times (10% _↔ 90%) are <5 nS.
Note: VIT: VINPUT Test; VOT: VOUTPUT Test; VIHT: VINPUT HIGH Test; VILT; VINPUT LOW Test
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